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DAY 1 | Tuesday 3.09.2024
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9:00-17:00 | Day 1
Registration
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10:00-16:00 | Day 1
Live SmartLab demo
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17:00 | Day 1
End of Registration
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18:00-21:00 | Day 1
Get Together Party in Rigaku Office
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| DAY 2 | Wednesday 4.09.2024 |
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9:00-9:10 | Day 2
Theodor Feldmann, Rigaku Europe SE
Welcome
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9:10-10:05 | Day 2
Edith Bellet-Amalric, CEA LETI in Grenoble, France
Thin films and nanostructures: out-of plane and in-plane X-ray diffraction using the Smartlab
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10:05-10:55 | Day 2
Vladimir Kaganer, The Paul-Drude-Institut für Festkörperelektronik (PDI) in Berlin, Germany
X-ray diffraction from dislocations in epitaxial films. General theory and Monte Carlo simulations. (Part 1)
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10:55-11:10 | Day 2
Coffee break
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11:10-12:00 | Day 2
Vladimir Kaganer, The Paul-Drude-Institut für Festkörperelektronik (PDI) in Berlin, Germany
X-ray diffraction from dislocations in epitaxial films. Applications to misfit and threading dislocations. (Part 2)
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12:00-12:25 | Day 2
Thomas Cornelius, Institut Matériaux Microélectronique Nanosciences de Provence (IM2NP), France
Structural analysis of accumulative roll bonded Cu/Nb nanolaminates using X-ray diffraction techniques
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12:25-13:30 | Day 2
Lunch
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13:30-14:15 | Day 2
Vaclav Holy, Charles University in Prague and Masaryk University in Brno, Czech Republic
Martensitic beta-to-omega transformation in Ti alloys - an x-ray scattering study
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14:15-14:50 | Day 2
Lutz Kirste, Fraunhofer IAF in Freiburg, Germany
Bragg Diffraction Imaging of Defects in GaN Crystals - Laboratory XRT vs. Synchrotron Rocking Curve Imaging
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14:50-15:10 | Day 2
Vladimir Kaganer, The Paul-Drude-Institut für Festkörperelektronik (PDI) in Berlin, Germany
Crystal truncation rods from superlattices grown in layer-by-layer mode
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15:10-15:25 | Day 2
Coffee break
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15:25-15:55 | Day 2
Anna Eden Kossoy, Weizmann Institute of Science, Rehovot, Israel
Characterization of surface guided Xanthine derivatives for optical metamaterial application
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15:55-16:55 | Day 2
Davide Altamura, Institute of Crystallography (IC-CNR), Bari, Italy
Multiscale Characterization of Nano/Bio-materials by Advanced X-ray Scattering Techniques from Laboratory Sources
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17:00-17:30 | Day 2
Lab Tour
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17:30-18:30 | Day 2
Poster Session
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19:00 | Day 2
Dinner at Ristorante Tonino (Neu-Isenburg)
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DAY 3 | Thursday 5.09.2024
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9:00-9:55 | Day 3
Dave Rogers, Nanovation, Paris Area, France
X-Ray Diffraction for the Development and Quality Control of Oxide Epiwafers
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9:55-10:30 | Day 3
Anna Eden Kossoy, Weizmann Institute of Science, Rehovot, Israel
Strain relaxation and order–disorder phase transition in irradiated MgAl2O4 spinel
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10:30-10:45 | Day 3
Coffee break
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10:45-11:45 | Day 3
Carsten Richter, Leibniz Institute for Crystal Growth | IKZ Berlin, Germany
Lab-based, quantitative X-ray diffraction imaging using the Rigaku SmartLab Diffractometer
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11:45:12:20 | Day 3
Ludovic Largeau, C2N - CNRS - Univ Paris Saclay, France
Epitaxy of GaN nanowires on graphene
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12:20-13:25 | Day 3
Lunch
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13:25-14:00 | Day 3
Olaf Soltwedel, TU Darmstadt, Germany
Specular and non-specular x-ray reflectometry at the free liquid/air interface
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14:00-14:35 | Day 3
Anna Eden Kossoy, Weizmann Institute of Science, Rehovot, Israel
Optical and Structural Properties of Ultra-thin Gold Films
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14:35-15:10 | Day 3
Christian Kranert, Fraunhofer IISB Erlangen, Germany
Application of X-ray topography for the full wafer scale analysis of semiconductor materials
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15:10-15:25 | Day 3
Coffee break
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15:25-15:45 | Day 3
Rigaku presentation by Tom Faske
Rigaku XRD Products (not only) for Thin Film Analysis
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15:45-16:00 | Day 3
Closing remark
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