In-line, Multi-element Coating Analyzer by EDXRF

Real-time, on-line coating analysis for roll-to-roll applications

NEX LS is a scanning multi-element coating analyzer that helps maintain routine quality control for web and coil applications. It is a compact, in-line energy dispersive X-ray fluorescence (EDXRF) system that provides valuable information about the coating’s properties or the product’s composition. Product quality depends on proper coating thicknesses or coat weight, or the elemental composition of a product. NEX LS allows continuous monitoring of these without the need to stop production.

NEX LS Overview

How does the NEX LS work?

NEX LS is an in-line scanning measurement system with an EDXRF analytical head assembly. It provides real-time results for elements aluminum (Al) to uranium (U) and is invaluable for roll-to-roll (R2R) manufacturing.

The analytical head sweeps back and forth across a moving web or coil, transmitting measurements to a console box and industrial touchscreen computer. Real-time data is displayed as a graphical cross-direction and machine-direction profile. You can choose full scanning mode or user-defined fixed analysis positions.

The intuitive design allows you to self-install and customize the system to meet your process control needs. Continuous monitoring helps you quickly identify quality and uniformity issues related to the entire roll as it's being produced.

Coat weight profiling—a clear visual representation of your process

NEX LS software is user-friendly and provides a clear visual representation of your process so that you can make immediate quality control decisions. A flow bar method builder helps you input basic information about your application, and the advanced NEX LS software helps you achieve continuous process control from the beginning to the end of the roll.

Roll reports include machine direction, cross direction, and full lane average graphs—measurement value, date, time, length, product name, and other information. You can customize reports, export them as PDF or CSV, and store copies on USB or a network using industry-standard communications protocols.

NEX LS allows you to monitor your process in real-time—from start to finish.

Coat weight analysis or loading analysis—solve challenges in real-time

Controlling coating thickness or composition is vital to meeting end-use specifications for the release, metal finishing, and automotive industries. If coatings or composition are not in spec throughout the process, this could lead to product rejection or failure. NEX LS helps solve the challenges of coating and converting processes in real-time.

Silicone coaters can achieve a targeted laydown to ensure release properties or barriers are not compromised. If too little or too much silicone is applied, this can change the product’s characteristics, resulting in product rejection and reduced profitability. With an increased demand for fuel cell and battery-powered electric vehicles, profiling the substrate or loading is crucial in manufacturing. NEX LS provides real-time results throughout these processes and is an excellent system for new product development.

NEX LS is an excellent choice for:

  • Silicone release coaters
  • Converters—silicone on plastic or paper
  • Vacuum-formed plastics—denesting silicone coatings
  • Specialty films—moisture and air barriers
  • Conversion coatings
  • Fuel cell loadings
  • Metalized plastic
  • Top coatings on metal coil

NEX LS Features

Cross-direction and machine-direction profiling
Full scanning or user-defined measurement patterns
Continuous monitoring for defect detection
Measure elements aluminum (Al) to uranium (U)
Industrial touchscreen user interface
Easy automatic calibration and routine operation
Robust Rigaku NEX Series optical kernel
Minimal routine maintenance

NEX LS Videos

NEX LS Specifications

Technique In-line energy dispersive X-ray fluorescence (EDXRF)
Benefit Helps maintain routine quality control for web and coil applications; in-line EDXRF for determining coating thicknesses or coat weight, or the elemental composition of a product
Technology Process EDXRF using a scanning analytical head featuring proven NEX Series optical kernel
Attributes 50 kV 4 W X-ray tube (limited to 5 kV for specific applications), SDD, analyze Al to U, home station with 5-position calibration plate, industrial widescreen touchscreen display with intuitive user interface and flow bar method builder, full scanning or user-defined positions, roll reports, CSV or PDF file logging to USB or a network using industry-standard communications protocols
Power requirements 100 – 240 V, 5.5 – 10 A (50/60 Hz), dedicated supply

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