X-ray spectrometer (JEOL JED-2300)

The XtaLAB Synergy-ED can be upgraded with an energy dispersive X-ray spectrometer (EDX/EDS) that is fully integrated with the 3D ED/MicroED workflow, providing elemental analysis on each single nanocrystal. The characteristic X-ray spectrum provides complementary information to the crystallographic structure solution, helping to unambiguously identify compounds and assign atom species. The EDX/EDS system features a 30 mm² windowless silicon drift detector and achieves an energy resolution better than 129 eV with excellent detection of light elements down to Be. Learn more at JEOL's website.