XSPA-200 ER
X-ray Seamless Pixel Array Detector
0, 1, and 2D pixel detector with high energy resolution for MiniFlex system
In general, X-ray diffraction measurements using a Cu X-ray source are known to have difficulty detecting trace crystalline phases because of increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-200 ER suppresses the fluorescent X-rays originating from the sample, thereby reducing background, enabling highly sensitive measurements of samples containing transition metals, such as iron and steel compounds and battery materials. Therefore, it achieves higher sensitivity measurements than conventional detectors, enabling the MiniFlex benchtop diffractometer to obtain higher quality measurement data.
XSPA-200 ER Overview
Multidimensional pixel detector
Since it supports 0, 1, and 2 dimensions, it is possible to obtain general X-ray diffraction patterns and shape measurements of Debye Scherrer rings, making it possible to measure a wide range of samples with the MiniFlex, from powders and bulk materials to thin films.
High linear coefficient and wide dynamic range
Observations from low to high intensities are possible.
Filterless Kβ measurements
Taking advantage of the high energy resolution feature, measurement without a Kβ filter is also possible.
XSPA-200 ER Features
XSPA-200 ER Specifications
| Technique | X-ray diffraction | |
|---|---|---|
| Energy resolution (CuKα) | 340 eV (when using fluorescent X-ray reduction mode) | |
| Number of pixels | 32,768 pixels | |
| Pixel size | 75 μm × 75 μm | |
| Count rate | >1 x 10⁵ cps/pixel | |
| Detection area | 19.2 ×9.6 = 184.32 mm² | |
XSPA-200 ER Resources
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