HyPix-Arc 100°

Curved Photon Counting X-ray Detector

Curved X-ray detector

The HyPix-Arc 100° is a curved Hybrid Photon Counting (HPC) X-ray detector for single crystal diffraction applications. HyPix-Arc 100° offers a 17° larger capture angle compared to the flat HyPix 6000 detector. Collect more data in a single exposure with less reflection profile distortion: 

HyPix-Arc 100° Curved photon counting detector

HyPix-Arc 100° Overview

The HyPix-Arc 100° offers 100 degrees angular coverage from edge to edge. This is more than enough to collect complete single crystal diffraction data, according to IUCr guidelines, for even Cu Kα X-ray wavelength from a single theta position. High and low angle data are measured at the same time, under the same conditions for better scaling, faster data and reduced dose time. A curved detector minimizes peak distortion by ensuring that, even at short crystal-to-detector distances, diffracted beams are closer to perpendicular than is possible with a flat geometry.

Like all HPC detectors, the HyPix-Arc 100° offers direct X-ray photon counting for every photon, single pixel top-hat point spread function with no readout noise and no dark noise. The 100 micron pixel size allows better resolution of reflections for long unit cells as well as improving reflection profile analysis. The HyPix-Arc 100° has a high frame rate of 100 Hz, as well as a Zero Dead Time mode providing the ultimate in error-free shutterless data collection.

The advantage of direct detection found in the HyPix-Arc 100° is that no scintillator is required, and the size of the pixel determines the point spread function rather than the blooming that occurs on detectors with a scintillator. This means that reflections are sharper and more easily resolved. Profile analysis will not require incorporating additional pixels to compensate for scintillator blooming leading to less experimental noise, such as air scatter, being incorporated into a reflection. As opposed to monolithic detectors, such as CMOS-based CPADs, a hybrid detector separates the detection area from the read-out electronics. This means that the full area of a pixel is sensitive to incoming X-ray photons, with the charge being transmitted through an indium bump bond to a secondary readout pixel. In APS-CMOS/CPAD detectors, each pixel contains in-pixel readout electronics that come at the expense of light sensitive area. Monolithic detectors used in crystallography often have a 30% dead area or detection-gap per pixel that occurs through the whole detector.

The HyPix-Arc 100° is the perfect detector for measuring diffraction from small and poorly diffracting samples due to the extremely low noise characteristics: you can count as long as you need to without the dark current or noise build up seen in other detectors. When your crystals diffract well, the high frame rate and Zero Dead Time mode mean that you can collect data extremely fast and accurately in a shutterless mode. 

HyPix-Arc 100° Features

Lowest reflection profile distortion
Faster data collection
Higher 2θ coverage in a single image
All reflections measured under the same conditions
Capture more diffracted photons per exposure

HyPix-Arc 100° Videos

HyPix-Arc 100° Specifications

Technique Single crystal X-ray diffraction
Benefit Curved photon counting detector
Technology Hybrid Photon Counting (HPC) X-ray detector
Attributes Water cooled, curved HPC detector
Computer External PC, MS Windows® OS, CrysAlisPro
Dimensions 193 (W) x 144 (H) x 254 (D) (mm)
Mass 8 kg approx. (core unit)
Power requirements 1Ø, 100-240 V, 15 A

HyPix-Arc 100° Application Notes

The following application notes are relevant to this product

  • SMX038 - Rigaku Rotating Anodes: Powerful and Reliable Sources for Seamless and High-throughput Small Molecule Structure Solution

  • SMX024 - Charge-density Data Collection on XtaLAB Synergy Diffractometers

HyPix-Arc 100° Events

Learn more about our products at these events

  • Rigaku Symposium at Yale
    May 27 2025 - May 28 2025
    New Haven, CT
  • Erice - 60th Course Electron Crystallography 2025
    May 29 2025 - June 6 2025
    Erice, Italy
  • Erice - 61st Course Quantum Crystallography 2025
    May 29 2025 - June 6 2025
    Erice, Italy
  • Polish Crystallographic Meeting 2025
    June 24 2025 - June 26 2025
    Wroclaw, Poland
  • Protein Society Meeting
    June 25 2025 - June 28 2025
    San Francisco, CA
  • ICDM10
    July 13 2025 - July 16 2025
    Durham, UK
  • ECM 35
    August 24 2025 - August 28 2025
    Poznan, Poland
  • AIC 2025 congress
    September 1 2025 - September 4 2025
    Florence Italy
  • EuroMOF 2025
    September 20 2025 - September 23 2025
    Crete, Greece
  • Rayons X et Matière 2025
    November 17 2025 - November 20 2025
    Orleans, France
  • AsCA 2025
    November 30 2025 - December 4 2025
    Taipei, Taiwan

Contact Us

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