Background measurement function

This option can be added to the Simultaneous Wavelength Dispersive X-ray Fluorescence Spectrometer, Simultix15. A single fixed channel can measure intensities at both peak and background angles (angles higher or lower than the peak angle).

Background intensities may vary between samples due to different matrix conditions. To improve the accuracy of quantitative analysis, especially for trace elements, it is necessary to create a calibration curve using NET intensity (the peak intensity of the target element minus the background intensity). When measuring background intensity using this option, the total number of elements that can be measured remains the same. Therefore, there is an advantage in that there is no need to add a dedicated fixed channel, which reduces costs.

Photo of Background measurement function

Compatible Products

Simultix15

High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U

View more

Contact Us

Whether you're interested in getting a quote, want a demo, need technical support, or simply have a question, we're here to help.