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Foreign material analysis using energy dispersive X-ray fluorescence spectrometers

Winter 2019 Volume 35, No. 1
24-29
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Yasushi Kusakabe

As a handy and quick elemental analysis technique, X-ray fluorescence spectrometry is widely used in many industrial fields. It should be noted that energy dispersive X-ray fluorescence (EDX) spectrometers provide opportunities for miniaturization, because their system configuration does not require a dispersive element or goniometer. In addition, because of their ability to analyze multiple elements simultaneously, these spectrometers demonstrate their superiority especially when a sample of unknown identity needs to be analyzed quickly. One of the best examples of this is analysis of foreign materials mixed into products. 

In recent years, safety awareness is increasing among consumers. If by any chance a foreign material is spotted in a product after shipment, the product manufacturer will be required to analyze the foreign material and to identify the route of contamination quickly and accurately. There are several types of techniques used for analyzing such foreign materials, but EDX spectrometers are excellent, especially in handiness and promptness, and are considered best suited for this type of analysis.

In this report, methodologies associated with analyzing foreign materials, using NEX DE energy dispersive X-ray fluorescence spectrometer, will be described. In addition, several examples of analyzing specific foreign material samples will be described.

 

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