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Winter 2011, Volume 27, No. 1

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Winter 2011 Volume 27, No. 1

X-ray thin-film measurement techniques VI. Small Angle X-ray Scattering

Aya Ogi and Katsuhiko Inaba

We have been making a series of papers for thin-film analysis techniques for characterization of crystalline qualities and crystal structures using High Resolution XRD (HR-XRD), or characterization of layer structures, such as film thickness, etc., using X-ray reflectivity (XRR) method. An X-ray analytical technique for the evaluation of particle/pore sizes...

Making high speed, high resolution measurements using MiniFlex II + D/teX Ultra

Yukiko Namatame

The MiniFlex II benchtop XRD system is widely used in a variety of fields. Its small size, high angular performance and dependable design lend it the flexibility necessary for this range application. Over time, our users have started to place higher demands on the system. There has been diversification in...

Detailed observations of dynamic changes such as phase transitions, melting and crystallization using an XRD-DSC with a high-speed, high-sensitivity two-dimensional PILATUS detector

Akira Kishi

X-ray diffractometry (XRD) and differential scanning calorimetry (DSC) are widely used to measure changes in the physical and chemical states (e.g., phase transition, crystallization, dehydration, decomposition) of solid substances. Rigaku Corporation’s instrument for simultaneous measurements of XRD and DSC (hereafter referred to as the XRD-DSC) is configured with a general...

Evolved gas analysis by thermogravimetry-differential thermal analysis-mass spectrometry (TG-DTA-MS) technique

Kazuko Motomura and Lani Llego Celiz

The thermogravimetry-differential thermal analysis (TG-DTA) is a simultaneous measurement technique where the material’s mass changes as well as energy changes are measured during heating and the macroinformation on the physico-chemical changes of the material can be concluded from the obtained data.  However, in order to fully understand the reactions that...

Benchtop X-ray diffractometer MiniFlex II + D/teX Ultra

The compact and safe designed MiniFlex II benchtop X-ray diffractometer provides the user with a remarkable degree of freedom—it can be installed almost anywhere you wish. This system will prevent user from radiation exposure by locking the door while X-rays are on. These features, among others, make it a very...

Dual wavelength rotating anode system MicroMax007 VariMax DW

The dual-wavelength system is attractive to crystallographers, chemists and material scientists who deal with various kinds of samples. It is critical to select an X-ray wavelength that is best suited to intended samples.

It is well known that selecting a suitable X-ray source is essential to successful experiments. However, changing...