Ceramics

X‑ray analyses for ceramics characterization

Ceramics are characterized throughout materials development and manufacturing to determine chemical composition, crystalline phases, microstructure, thermal behavior and internal defects. X-ray diffraction (XRD) identifies and quantifies crystalline phases and can evaluate crystal structure, crystallite size, orientation and other structural properties. X-ray fluorescence (XRF) determines elemental composition from major oxides to trace elements and is widely used for raw-material and quality-control analysis.

Other techniques provide complementary information. Thermal analysis can characterize binder removal, sintering behavior, dimensional changes, thermal expansion and phase transitions. X-ray computed tomography (CT) provides non-destructive 3D visualization of pores, cracks, inclusions and other internal features, including changes that occur during ceramic additive manufacturing.