Skip to main content

Defective site analysis of LED package by CT slices and volume rendering

AppNote XRI1003: Defective site analysis of LED package by CT slices and volume rendering

Background

In micro X-ray CT, projection images of X-rays transmitted through a minute object are reconstructed to produce a high-resolution 3D transmission image. By displaying the reconstruction image in 2D slices and 3D volume renderings, the inner structures and defects in the object can be analyzed non-destructively. Here, a damaged LED package was subjected to X-ray micro CT and a defective site was revealed.

X-ray imaging products from Rigaku

High-speed, stationary sample microtomography of large samples

High-resolution benchtop microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry