A bespoke, extremely high-flux diffractometer with custom enclosure and the flexibility to utilize both ports of the rotating anode X-ray source.
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer
A cost-effective solution for departments looking for targeted chemical threat analysis
Offers features and benefits that maximize chemical threat analysis in safety and security applications
Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
Provides presumptive identification of narcotics, precursor chemicals, and cutting agents