AutoMATE II
Features
- Highly accurate goniometer allows for true micro-area residual stress measurement.
- Automatic mapping measurements with teaching function.
- Large and heavy samples are measured with high accuracy.
- An X-ray radiation enclosure with interlock system automatically locks the enclosure door when the X-ray shutter is open.
- The measurement position is adjusted by a CCD camera equipped with a microscope having a zoom function.
- The two-axis goniometer system allows for both iso-inclination and side-inclination methods automatically without readjustment of the sample position.
Micro-area X-ray residual stress measurement system
Highly accurate micro area residual stress with both iso- and side-inclination methods
Specifications
Product name | AutoMATE II |
Technique | X-ray diffraction (XRD) |
Benefit | Residual stress measurement on large and/or heavy objects by XRD |
Technology | Specialty 2-axis X-ray diffractometer with mapping capability |
Core attributes | 3 kW sealed X-ray tube, D/teX Ultra 1000 silicon strip detector |
Core options | Automated XYZ stage, CCD microscope with zoom function |
Computer | External PC, MS Windows® OS, AutoMATE II for Windows |
Core dimensions | 1200 (W) x 1910 (H) x 1320 (D) mm |
Mass | Approx. 1060 kg (core unit) |
Power requirements | 3Ø, 200 VAC 50/60 Hz, 20 A, 69 kW |