教育領域
用於教學的桌上型X光分析儀器
我們提供種類豐富的桌上型X光分析儀器,包括X光繞射(XRD)、X光螢光(XRF)及X光電腦斷層掃描(CT)儀器,具有堅固耐用、操作簡便、維護成本低等特點,適合教學環境使用。此外,手持式拉曼光譜也可用於幫助學生直觀地瞭解材料鑑定在各行各業中的實際應用。這些儀器是開展基礎分析技術教學的理想選擇。
推薦產品
未找到心儀產品?立即體驗“產品檢索器”
應用說明
探索成功應用案例,選出最佳分析技術
-
XRD1014 - Ab-initio Crystal Structure Determination of a Cu-MOF Using Powder Diffraction Data Obtained from a Benchtop X-ray Diffractometer
-
WDXRF1116 - Lead Analysis in Gasoline — ASTM D5059-21 — using Benchtop WDXRF Supermini200
-
WDXRF1115 - Cement Analysis by the Fusion Method on Benchtop WDXRF Supermini200 According to ASTM C114-18
-
WDXRF1114 - Cement Analysis by the Pressed Powder Method on Benchtop WDXRF Supermini200 According to ASTM C114-18
-
WDXRF1092 - Fixed Angle Measurement using the Semi-Quantitative Analysis Function SQX of ZSX Guidance Software
-
WDXRF1090 - Semi-quantitative Analysis of Recycled Solid Fuel with Benchtop WDXRF Supermini200
-
WDXRF1082 - Sulfur Analysis in Crude Oil and high-sulfur Fuels by Benchtop WDXRF according to ASTM D2622-16
-
WDXRF1081 - Analysis of Low-concentration Sulfur in Petroleum-based Fuels by Benchtop WDXRF according to ASTM D2622-16
-
WDXRF1080 - Sulfur Analysis in Petroleum Products by Benchtop WDXRF According to ASTM D2622-16
-
WDXRF1079 - Lubricating Oil Analysis by Benchtop WDXRF according to ASTM D6443-14
-
WDXRF1063 - Thickness/composition of ITO Thin Film by FP Method
-
WDXRF1062 - Quantitative Analysis of Soda-lime Glass
-
WDXRF1061 - Polymetallic Sulfide Ore Analysis with Supermini200
-
WDXRF1060 - Elemental Determination of Whole Coal by the Pressed Powder Method
-
WDXRF1059 - Semi-quantitative Analysis of Glass Raw Materials
-
WDXRF1058 - Quantitative Analysis of Dolomite and Limestone by Pressed powder Method with Supermini200
-
WDXRF1055 - Quantitative Analysis of Aluminum Alloy on Supermini200
-
WDXRF1052 - Accurate Determination for Elements in Laterite Ores by Pressed Powder Method
-
WDXRF1048 - Fused Bead Analysis for Wide Concentration Ranges of Various Oxide Materials on Benchtop WDXRF
-
WDXRF1047 - Highly Accurate Determination of Total Iron in Natural and Processed Iron Ores using Pressed Powder Method
-
WDXRF1042 - Quantitative Analysis of Low Alloy Steel using the Supermini200
-
WDXRF1041 - Copper Concentrate by Pressed Powder Method
-
WDXRF1040 - Cement Raw Meal by the Pressed Powder Method
-
WDXRF1036 - Semiquant Analysis by the SQX Scatter FP Method
-
RAD9150 - Identification of Fentanyl Precursors with Handheld 1064 nm Raman
-
RAD9140 - Household Hazardous Material Identification using Handheld 1064 nm Raman
-
RAD9130 - Narcotics Identification using Rigaku CQL Narc-ID Handheld Raman
-
RAD9110 - Presumptive Field Testing for Narcotics, Explosives and Chemical Warfare Agents with Handheld 1064 nm Raman
-
RAD9100 - Novel Psychoactive Substances (NPS) Identification using Rigaku Raman
-
RAD9060 - Presumptive Identification of Xylazine - an Emerging Threat in Street Drugs
-
RAD9040 - Combatting the Fentanyl Epidemic using Handheld 1064 nm Raman
-
RAD9030 - Advanced 1064 nm Raman used to Counter Threats in Transportation Screening
-
RAD9010 - Chemical Warfare Agent (CWA) Identification using Rigaku Handheld Raman Spectroscopy
-
RAD9000 - Homemade Explosives Analysis
-
RACCT9046 - Wild Bird Forensic
-
RACCT9044 - Rapid-release Pain Medication Capsule Comparison by X-ray CT
-
RACCT9043 - Multivitamin Tablet Analysis by X-ray CT
-
RACCT9039 - Compression Methods Comparison by X-ray CT
-
RACCT9035 - Solder Voids in PCB
-
RACCT9034 - Delamination in Lithium-ion Batteries
-
RACCT9033 - Water Flosser Tip Stress Simulation using X-ray CT Scan
-
RACCT9032 - Plastic Parts Quality Control and Reverse Engineering by X-ray CT
-
RACCT9031 - Plastic Locking Parts Dimensional Comparison by X-ray CT
-
RACCT9030 - Nesting Doll Dimensional Analysis by X-ray CT
-
RACCT9029 - Golf Ball Layer Thickness Analysis by X-ray CT
-
RACCT9028 - Bottlecap Air Gap Analysis by X-ray CT
-
RACCT9027 - Aluminum Part Dimensional Analysis by X-ray CT
-
RACCT9026 - Aluminum Die Casting Void Analysis by X-ray CT
-
RACCT9025 - 3D Printed Plastic Dimensional Analysis by X-ray CT
-
RACCT9024 - Tomato Plant Root System Analysis by X-ray CT
-
RACCT9022 - Coral Surface Area and Porosity Analysis by X-ray CT
-
RACCT9021 - Cicada Analysis by X-ray CT
-
RACCT9020 - Three sandstone porosity comparison by X-ray CT
-
RACCT9019 - Sandstone pore network analysis by X-ray CT
-
RACCT9018 - Sandstone Grain Size Analysis by X-ray CT
-
RACCT9017 - Sand Oil and Brine Segmentation by X-ray CT
-
RACCT9016 - Rock Crack Analysis by X-ray CT
-
RACCT9015 - Granite Phase Fraction Analysis by X-ray CT
-
RACCT9014 - Carbonate porosity analysis by X-ray CT - Segmentation comparison
-
RACCT9013 - Ammonite Fossil Scan by X-ray CT
-
RACCT9011 - Processed Meat Fat and Protein Analysis Distribution Analysis by X-ray CT
-
RACCT9010 - Pretzel Coating Thickness Analysis by X-ray CT
-
RACCT9008 - Breading Air and Oil Distribution Analysis by X-ray CT
-
RACCT9004 - Particleboard Packing Density Analysis by X-ray CT
-
EDXRF3226 - NEX CG II - Analysis of Nutrients in Silage
-
EDXRF3214 - NEX CG II - Elemental Analysis of Glass and Raw Materials
-
EDXRF3209 - NEX CG II - Analysis of Coal
-
EDXRF3198 - NEX CG II - Animal Feed Analysis
-
EDXRF3144 - NEX CG II - Analysis of Lube Oils by ASTM D7751
-
EDXRF3142 - NEX CG II - Analysis of Coal Fly Ash
-
EDXRF3137 - NEX CG II - Ultra Carry Detection Limits
-
EDXRF3134 - NEX CG II - Analysis of Rare Earth Elements in Clay
-
EDXRF3133 - NEX CG II - Analysis of Air Filters - U.S. EPA Sensitivity
-
EDXRF3122 - NEX CG II - Ultra Carry Detection Limits
-
EDXRF3064 - NEX CG II - Analysis of Air Filters - U.S. EPA Sensitivity
-
EDXRF3051 - NEX CG II - Analysis of Cement and ASTM C114 Qualification
-
EDXRF3001 - NEX CG II - Pb in Gasoline by ASTM D5059 Methods C and A
-
EDXRF3000 - NEX CG II - EPA Tier 3 Gasoline
-
EDXRF2099 - Manganese in Gasoline by ASTM D5059 Method D
-
EDXRF2096 - Organic Chlorides in Crude by ASTM D4929 Procedure C
-
EDXRF2095 - Analysis of ULSD
-
EDXRF1994 - Material Identification
-
EDXRF1970 - Metals in Crude and Resid as per ASTM D8252
-
EDXRF1884 - Alloy Powders for 3D Printing
-
EDXRF1853 - Analysis of Fiberglass
-
EDXRF1495 - Analysis of Lead (Pb) / Zinc (Zn) Ore
-
EDXRF1385 - Agricultural Soils and Plant Materials
-
EDXRF1241 - Analysis of Gemstones
-
EDXRF1108 - Analysis of Limestone
-
EDXRF1061 - Analysis of Heavy Metals in Aerosols on Air Filters
-
EDXRF1054 - SiO₂, AlSi, Ti, TiN, Pt, AlCu, and BPSG on Silicon
-
EDXRF1033 - Chlorine and RoHS Elements in Polyethylene
-
EDXRF1023 - Analysis of PVC Resins
-
BATT1022 - Particle Distribution Analysis and Crack Analysis in Lithium-Ion Batteries
-
BATT1014 - Measurement of Li₇P₃S₁₁ Solid-State Electrolyte Using Airtight Sample Holder
-
BATT1013 - Crystallite Diameter and Particle Diameter Calculation for Silicon Negative Electrode Material
-
BATT1008 - Impurity Analysis for Silicon Metal Anode Material
-
BATT1005 - Main Component Analysis for NCM Cathode Material
-
BATT1004 - Composition Analysis for Nickel Laterite
-
BATT0006 - Failure Analysis of a Multilayered Battery Cell
-
BATT0001 - Battery Material Development
-
B-XRI1024 - Fiber orientation analysis of short fibers in GFRPs by micro X-ray CT
-
B-XRI1023 - Analysis of potato thickness and oil particle size in potato chips by micro X-ray CT
-
B-XRI1016 - Observation and Analysis of Laminated Films by Micro X-ray CT
-
B-XRI1015 - Observation of Lyophilized Formulations by Micro X-ray CT
-
B-XRI1003 - Defective Site Analysis of LED package by CT slices and Volume Rendering
-
B-XRD1168 - Phase identification and Quantitative Analysis of Nickel Ore by X-ray Diffraction
-
B-XRD1166 - Phase Identification and Quantitative Analysis of Copper Ore by X-ray Diffraction
-
B-XRD1165 - Phase Identification and Quantitative Analysis of Iron Ore by X-ray Diffraction
-
B-XRD1150 - Evaluation of Graphitization Degree of Lithium-ion Battery Carbon Anode Material by X-ray Diffractometry
-
B-XRD1147 - High-precision Quantitative Analysis of Clinker Mineral Polymorphs by Rietveld Refinement
-
B-XRD1146 - Quantification of Blast Furnace Slag by Rietveld Refinement using Reference Intensity Ratio
-
B-XRD1140 - Accurate and Highly Precise Quantitative Analysis of Cement Samples using Rietveld Refinement
-
B-XRD1133 - Observation of Phase Transition Behavior of Pharmaceutical Materials with a Benchtop XRD System
-
B-XRD1127 - Background Reduction for Iron Oxide with CuKα X-rays using XRF Mode
-
B-XRD1111 - Quantitative Analysis of 3-component Sample by DD method
-
B-XRD1101 - High-T analysis - MiniFlex with HyPix-400 MF / BTS 500
-
B-XRD1093 - Quantitative Analysis of Amorphous Components in Cement
-
B-XRD1081 - Quantitative Analysis of Polymorphic Impurities in a Drug Substance by the Calibration Method
-
B-XRD1076 - Rietveld Quantitative Analysis of Trace Components in Cement
-
B-XRD1072 - Crystallite Size Analysis Analysis of a Microvolume of Metallic Nanoparticles with a Benchtop X-ray Diffractometer
-
B-XRD1071 - Crystallite Size Analysis of a Catalyst Material by the Scherrer Method
-
B-XRD1063 - Measurement of a Film Sample
-
B-XRD1060 - MiniFlex Measurement of Trace Samples
-
B-XRD1002 - Quantification of a 4-component Sample using RIR method
-
B-XRD1001 - Quantitative Analysis of a 4-component Sample