SmartLab Studio II
理學 X光繞射儀軟體系統
整合用戶權限管理、測量控制、數據分析、數據可視化及報告生成等全流程功能
SmartLab Studio II 是理學為旗艦產品SmartLab X光繞射儀 開發的新一代 Windows平臺整合軟體，核心功能涵蓋了用戶權限管理、測量控制、數據分析、數據可視化及報告生成等全流程功能，目前已用於 MiniFlex系列繞射儀，可達到各功能零件間的先進級相互配合操作。
/SmartLab%20Studio%20II%20splash%20screen.png?width=800&height=610&name=SmartLab%20Studio%20II%20splash%20screen.png)
SmartLab Studio II 概覽
專業級XRD分析結果，零專業門檻即可獲得
SmartLab Studio II（SLS II）是理學SmartLab多功能X光繞射儀的智慧自動化核心引擎。透過引導用戶選擇最佳配置、光學系統對準，推薦最優測量條件，徹底改變了XRD實驗中的操作方式。
SLS II無需用戶記住複雜的參數或手動校準系統：軟體內建的智慧引導系統可透過提問明確掌握用戶的測量目標後，自動完成全流程配置——利用智慧感測器檢查目前的設定、提示必要的調整建議、自動完成光學元件與樣品對準，並啟動高品質數據採集，全程僅需最少的人工干預。
SLS II將自動校準、引導式設定與進階數據可視化整合於統一平臺，讓實驗室中的每位用戶都能更快速、更輕鬆、更高效地運用XRD。
用戶可以在同一操作界面中同時展開實驗掃描監控與數據同步分析：透過簡潔的流程欄界面，僅需一鍵就可完成“測量模組→分析模組”的切換，嚮導將引導完成數據分析與報告生成的全流程。SLS II支援多元化分析領域，包括包括物相鑑定、反射率分析、殘餘應力測試、倒易空間映射、晶粒尺寸計算、晶格常數精修、Rietveld精修、第一原理計算結構解析、原位或operando分析以及聚類數據分析；其全面的數據可視化工具可簡化複雜的數據分析和報告生成流程。
公告：全散射測量與 PDF 分析
SmartLab Studio II 的PDF 外掛程式已新增逆向蒙特卡洛（RMC）模組。有關全散射測量和 PDF 分析的技術細節，詳情請造訪全散射測量和 PDF 分析。
SmartLab Studio II 功能
SmartLab Studio II 影片
SmartLab Studio II 選配項目
本產品可選配以下配件：
/XRD%20Measurement-A_en%20(1).jpg)
/PowderXRD-A_en%20(1).jpg)
/sls-ai-phase-01.png)
AI Plugin - Phase Identification
This module can improve your productivity when you often analyze similar samples but have difficulty identifying minor phases such as impurities, foreign materials, etc.
/sls-ai-comp-f2.png)
AI Plugin - XRD Component Decomposition
This AI-powered module can separate an X-ray diffraction (XRD) pattern of an unknown mixture into multiple components and quantify each phase.
/sls-ai-xrr-01.png)
AI Plugin - X-ray Reflectivity Analysis
This AI-powered module can suggest how to adjust your simulation model to improve the quality and accuracy of X-ray reflectivity (XRR) analysis.
/PDF%20Analysis%20Figure%201%20-%20X-ray%20total%20scattering%20profiles%20of%20crystalline%20and%20amorphous%20carbon.png)
PDF Analysis
The PDF can extract information about interatomic distances and coordination numbers from scattering patterns independent of the crystallinity of the material.
/Outline%20of%20structure%20modeling%20by%20RMC.jpg)
RMC Method
The RMC method provides real space information as follows: revised structure mode, partial correlation, angular histogram.
/Total%20Scattering%20Figure%204.jpg)
Total Scattering Measurement
The Total Scattering Measurement uses not only diffraction peaks but also diffuse scattering, which is treated as background in powder XRD measurement, for analysis.
/PDF%20Software%20Figure%2012.png)
Measurement and PDF plug-in
An integrated software package for X-ray analysis from measurement to analysis.
/XRR-A_E.png)
XRR Plugin
X-ray reflectivity analysis software for a wide range of applications, from film thickness to detailed multilayer structure analysis
/stress01.jpg)
/HRXRD-A_E.png)
HRXRD Plugin
An integrated reciprocal lattice map and high-resolution rocking curve plugin for epitaxial films analysis
/Texture_B_Ribbon_EN.png)
Texture Plugin
Texture plugin is designed to analyze the ODF (Orientation Distribution Function) from pole figure data measured with 0D or 2D detectors.
/MRSAXS-D.png)
MRSAXS Plugin
Determination of particle/pore size distribution ranging from nano- to submicron order
/PDF-D.png)
PDF Plugin
The PDF plugin can calculate RDF (radial distribution function) and PDF (pair distribution function) with Fourier transform of S(Q) (Structure factor).
/DataVisualization-A_eng.png)
Data Visualization Plugin
The Data Visualization plugin efficiently processes thousands of data sets collected by operando measurements such as temperature-controlled measurements and displays the results in an easy-to-understand manner.
/XRD-DSC-A_e.png)
/Plugin_EasyX_en.png)
EasyX Plugin
Screening/plugin for quality control affording easy measurement, automated analysis and visualization of analysis result
SmartLab Studio II 應用說明
以下應用說明與本產品相關
-
B-XRD1166 - Phase Identification and Quantitative Analysis of Copper Ore by X-ray Diffraction
-
B-XRD2037 - Evaluation of Native Oxide Film on Larger-diameter Silicon Substrates Using High-precision Thin Film XRD for Advanced Research
-
B-XRD1162 - In-situ Evaluation of Orientation in Polymer Films at Different Draw Ratios by Wide Angle X-ray Scattering
-
B-XRD1169 - Temperature-dependent Analysis of Polymer Crystallization Behavior Using High-speed Time-resolved Measurement
-
B-XRD1165 - Phase Identification and Quantitative Analysis of Iron Ore by X-ray Diffraction
-
XRD1014 - Ab-initio Crystal Structure Determination of a Cu-MOF Using Powder Diffraction Data Obtained from a Benchtop X-ray Diffractometer
-
XRD2001 - Orientation and Residual Stress Evaluation in Metal Thin Films
-
XRD1161 - MiniFlex XpC for Clinker Application
-
XRD1160 - Fast Analysis of Mineralogical Phases in Blended Cements using Miniflex XpC
-
PHRM0002 - In-Situ DSC-Humidity PXRD Analysis for Pharmaceuticals
-
BATT0002 - Battery Material Characterization
-
BATT0001 - Battery Material Development
-
B-XRD1155 - Detection of trace components in battery cathode materials using a seamless pixel array detector
-
B-XRD1148 - Composition ratio classification of ternary cathode material by cluster analysis
-
B-XRD1143 - Verifying the Validity of Crystallite Sizes Determined by the FP Method
-
B-XRD1129 - Variable Humidity Measurement of a Drug Substance using XRD-DSC and a Humidity Controller
-
B-XRD1109 - Structure Determination of Ferroelectric Nano-powder by PDF Analysis
-
B-XRD1131 - Structural Characterization of Zeolite by PDF Analysis
-
B-XRD1136 - Structural Characterization of Zeolite by Electron Density Analysis
-
B-XRD1112 - Structural Analysis of Amorphous Silica by PDF Analysis
-
B-XRD3001 - Stress Distribution of a Shot Peened Coil Spring
-
B-XRD1123 - Simultaneous Operando XRD Measurement for Positive and Negative Electrode Materials
-
B-XRD1076 - Rietveld Quantitative Analysis of Trace Components in Cement
-
B-XRD1080 - Rietveld Analysis of Battery Material using a Mo Source
-
B-XRD1118 - Quick Pole Figure Measurement of a Metal Material using 2DD
-
B-XRD1119 - Quantitative Characterization of Polymer film by Orientation Function
-
B-XRD1081 - Quantitative Analysis of Polymorphic Impurities in a Drug Substance by the Calibration Method
-
B-XRD1120 - Quantitative Analysis of Pharmaceutical Polymorphic Forms via the DD Method
-
B-XRD1115 - Quantitative Analysis of γ-Al₂O₃ by the DD Method
-
B-XRD1132 - Quantitative Analysis of Glass with the DD Method
-
B-XRD1142 - Quantitative Analysis of Crystal Polymorphs by the DD Method
-
B-XRD1093 - Quantitative Analysis of Amorphous Components in Cement
-
B-XRD1001 - Quantitative Analysis of a 4-component Sample
-
B-XRD1111 - Quantitative Analysis of 3-component Sample by DD method
-
B-XRD1125 - Quantification of the Taste of Salt by DD (Direct Derivation) Method
-
B-XRD1146 - Quantification of Blast Furnace Slag by Rietveld Refinement using Reference Intensity Ratio
-
B-XRD1002 - Quantification of a 4-component Sample using RIR method
-
B-XRD1043 - Powder Crystal Structure of Organic Crystals
-
B-XRD1121 - Phase Identification of Mixed Powder by Real-time Analysis
-
B-XRD2023 - Phase Identification of an Organic Thin Film by GIWAXS Measurement with a 2D detector
-
B-XRD1103 - Phase Identification of a Coarse-grained Trace Component in a Mineral Powder using 2D XRD
-
B-XRD2020 - Phase ID and Orientation Analysis for Thin Film SOFC Material using 2DD
-
B-XRD1137 - Phase ID Analysis of Micro-impurities on the Surface of a Tablet by Micro-area XRD Measurements
-
B-XRD1021 - Phase Changes of Pharmaceuticals as a Function of Temperature and Humidity
-
B-XRD1110 - Particle Size Distribution Analysis of Ferroelectric Nanopowder by USAXS
-
B-XRD1102 - Particle Size / Distribution of Pigment Ink by USAXS
-
B-XRD1030 - Particle Diameter Distribution of Gold Nanoparticles
-
B-XRD2009 - Orientation Analysis of Organic Thin Film on Single Crystal Sub by In-plane XRD
-
B-XRD1124 - Operando Transmission XRD Measurement of All-solid-state Lithium-ion Battery using Ag Source
-
B-XRD2028 - Off-normal Fiber Texture Analysis by Pole Figure Measurement
-
B-XRD1133 - Observation of Phase Transition Behavior of Pharmaceutical Materials with a Benchtop XRD System
-
B-XRD2032 - Observation of Orientation State of Polypropylene Film Products by 2D-GIWAXS Measurement
-
B-XRD1020 - Observation of Dehydration Process of Hydrate by XRD-DSC
-
B-XRD1128 - Observation of Dehydration Behavior of a Drug Substance using TG-DTA and XRD-DSC
-
B-XRD1026 - Observation of Crystallization Behavior of Ionic Liquids by XRD-DSC
-
B-XRD1135 - Observation of Butter Crystal by Simultaneous XRD-DSC Measurement
-
B-XRD1060 - MiniFlex Measurement of Trace Samples
-
B-XRD1089 - Micro-area Mapping Measurement of Printed Circuit Boards
-
B-XRD1023 - Measurement of Pseudo-polymorph Impurities in Tablets
-
B-XRD1063 - Measurement of a Film Sample
-
B-XRD1107 - Material Characterization by PDF and RDF Analysis
-
B-XRD1114 - LOQ of Trace Impurities in API by the DD Method
-
XRD1003 - How to Evaluate Solid Pharmaceutical Drugs (3): Confirming Hydrates
-
XRD1002 - How to Evaluate Solid Pharmaceutical Drugs (2): Confirming the Presence/absence of Amorphous Substances
-
XRD1001 - How to Evaluate Solid Pharmaceutical Drugs (1): Confirming the crystal form of an API
-
B-XRD1101 - High-T analysis - MiniFlex with HyPix-400 MF / BTS 500
-
B-XRD1105 - High-speed in-situ Measurement of Melting Process of Metal
-
B-XRD1147 - High-precision Quantitative Analysis of Clinker Mineral Polymorphs by Rietveld Refinement
-
B-XRD2021 - High-speed RSM of an Epitaxial Film by 1D Detection Mode
-
B-XRD2024 - High-speed RSM of a III-nitride Epitaxial Film by 1D Detection Mode
-
B-XRD2030 - Evaluation of Uniformity of Thin Film Thickness by X-ray Reflectivity Mapping
-
B-XRD2027 - Evaluation of Uniformity of a Single Crystal Substrate by Rocking Curve Measurement
-
B-XRD1122 - Evaluation of the Crystallinity of a Carious Tooth using X-ray Diffraction
-
B-XRD3005 - Evaluation of Residual Stress of Thin Films by GI-XRD and the Multiple hkl Method
-
B-XRD1113 - Evaluation of Oxidation State by the BVS Method
-
B-XRD1150 - Evaluation of Graphitization Degree of Lithium-ion Battery Carbon Anode Material by X-ray Diffractometry
-
B-XRD1104 - Evaluation of Grain Condition and Orientation of Cemented carbide using 2D XRD
-
B-XRD2031 - Evaluation of Curvature of a Single Crystal Substrate by Rocking Curve Measurement
-
B-XRD1078 - Evaluation of Crystallite Size and Pore Size distribution of Fuel Cell Materials
-
B-XRD1149 - Evaluation of Barium Titanate Polymorphs by Rietveld Analysis
-
B-XRD1108 - Direct Observation of Melting and Crystallization of Fresh Cream
-
B-XRD1126 - Crystallization of Chocolate Observed by XRD-DSC
-
B-XRD1018 - Crystallite Size Distribution of Zinc Oxide Nanoparticles
-
B-XRD1072 - Crystallite Size Analysis Analysis of a Microvolume of Metallic Nanoparticles with a Benchtop X-ray Diffractometer
-
B-XRD1071 - Crystallite Size Analysis of a Catalyst Material by the Scherrer Method
-
B-XRD1035 - Crystal Structure Analysis of a Powder Sample of Pharmaceutical Cocrystals by the Rietveld Method
-
B-XRD2006 - Crystal Orientation Evaluation of Epitaxial Film and Ultrathin Buffer Layers by In-plane Reciprocal Space Mapping
-
B-XRD1014 - Crystal Orientation Analysis of Rolled Sheet Material by Pole Figure Measurement
-
B-XRD2022 - Crystal Defect Analysis by X-ray Reflection Topography
-
B-XRD1139 - Calculation of Molecular Stacking Spacing of Copper Phthalocyanine using PDF Analysis
-
B-XRD2025 - Analysis of Uniaxially Oriented Film by Wide-range RSM
-
B-XRD2026 - Analysis of Epitaxial Films on In-plane Anisotropic Substrates by Wide-Range RSM
-
B-XRD1141 - Observation of time-dependent hydration reaction by X-ray diffractometry
-
B-XRD1140 - Accurate and Highly Precise Quantitative Analysis of Cement Samples using Rietveld Refinement
-
B-XRD1011 - Temperature Dependence of a Lattice Constant
-
B-XRD1170 - Phase Identification of a Black Foreign Material on a Sintered BaTiO₃ Ceramic using Micro-area X-ray Diffraction
-
B-XRD2038 - Full-wafer Mapping Evaluation of Metal Films on an 8-inch Wafer using the Rθ Attachment
-
B-XRD1168 - Phase identification and Quantitative Analysis of Nickel Ore by X-ray Diffraction
-
B-XRD2039 - Observation of Anisotropic and Nonlinear Thermal Expansion of Thin Films on Substrates by In-Plane X-ray Diffraction
-
B-XRD2034 - Twist Width Evaluation of Group III-V Nitride Films by Rocking Curve Measurement
-
B-XRD1127 - Background Reduction for Iron Oxide with CuKα X-rays using XRF Mode
SmartLab Studio II 資源
網路研討會
| X光繞射技術在電池研究中的應用 | 觀看錄音 |
| 日常電池分析的對分佈函數 (PDF) 分析 | 觀看記錄 |
| 如何進行原位（operando） XRD 實驗 | 觀看記錄 |
| 何時使用 XRD 以及如何為鋰離子電池研究設定實驗 | 觀看影片 |
| 同步XRD-DSC - 整合兩者技術，發揮更大效益 | 觀看記錄 |
| 製藥領域中的成分分析和無標樣定量分析 | 觀看記錄 |
| X 光繞射 (XRD) 在石棉和可吸入二氧化矽中的深度應用綜述 | 觀看記錄 |
| 基於彎曲成像板的實驗室級快速 X 光全散射測量技術及其在PDF 分析中的應用 | 觀看記錄 |
| XRD-DSC 共同使用技術在製藥領域的應用研究 | 觀看記錄 |
| 難溶性藥物溶出速率的提升 - X 光繞射在藥物製劑開發中的關鍵作用 | 觀看記錄 |
| XRD-DSC 共同使用技術在製藥領域的應用研究 | 觀看影片 |
| SmartLab Studio II 軟體中Part 11 合規性功能解析 | 觀看影片 |
| Rietveld精修方法中的繞射光譜圖分析 | 觀看影片 |
理學雜誌文章
 全 X 光散射 (TXS) 外掛程式 |
閱讀文章 |
| 水泥材料的定量分析 |
閱讀文章 |
| SmartLab Studio II 數據可視化外掛程式 - 使用 CBO-μ 繪製微小區域 XY 映射的分析示例 |
閱讀文章 |
| 使用 SmartLab Studio II 的實時分析和顯示功能 |
閱讀文章 |
| 整合 X 光繞射軟體 -- SmartLab Studio II |
閱讀文章 |
| 整合 X 光繞射軟體 / SmartLab Studio II |
閱讀文章 |
出版物
造訪出版物圖書館 ，查閱與 SmartLab Studio II 相關的文章
SmartLab Studio II 活動
在以下活動中深入了解我們的產品
-
活動日期地點活動網站
-
AAPS PharmSci 360 - 20262026年10月25日 - 2026年10月28日New Orleans, LA, USA
-
Conférence GDR MATEPI2026年11月2日 - 2026年11月6日Nice, France
-
SERMACS 20262026年11月4日 - 2026年11月7日Memphis, TN, USA
-
34th Leoben-Conference on Polymer Engineering and Science2026年11月5日 - 2026年11月6日Leoben, Austria
-
IWN2026（International Workshop on Nitride Semiconductors 2026）2026年11月8日 - 2026年11月13日Kumamoto, Japan
-
Webinar: Integrate Analytical Instruments into Your Self-driving Lab2026年11月11日 - 2026年11月11日Webinar
-
Eastern Analytical Symposium (EAS) 20262026年11月16日 - 2026年11月18日New Jersey
-
MATERIAUX 20262026年11月16日 - 2026年11月20日Grenoble, France
-
German Epitaxy Workshop2026年11月25日 - 2026年11月27日Freiburg, Germany
-
MRS Fall 20262026年11月29日 - 2026年12月4日Boston, MA, USA
-
Advanced Automotive Battery Conf 20262026年12月8日 - 2026年12月11日Las Vegas, NV, USA
SmartLab Studio II 訓練
即將舉辦的訓練課程
-
標題日期費用地點備註課程大綱報名表單
-
SmartLab training (EMEA)2027年3月7日 - 2027年3月11日Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
-
SmartLab training (EMEA)2027年6月27日 - 2027年7月1日Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
-
SmartLab training (EMEA)2027年10月17日 - 2027年10月21日Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
