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SmartLab SE 概覽
SmartLab Studio II軟體整合智慧引導專家系統，可針對特定應用的測量需求，自動推薦最優硬體配置和參數設定。該軟體能篩選適合的光學元件，確定儀器設定並執行測量，實現全自動的測量流程。此外，得益於SmartLab SE的內建零組件識別功能，智慧引導系統不僅能提供最優配置 ，還會在配置不當時發出警告。專家級智慧決策與硬體配置驗證相結合，共同構築了SmartLab SE平臺的基礎。
HyPix-400：新一代二維偵測器
伴隨著 SmartLab SE，理學同步推出了可選配的 HyPix-400偵測器。這是一款專為多功能X光繞射儀設計的半導體混合像素陣列偵測器。具備大且有效偵測面積、高角度解析度和超高動態範圍三大優勢，是粉末繞射、薄膜繞射等多領域下兼具性能與經濟實惠的二維偵測解決方案。此外，系統支持D/teX Ultra 250 矽條偵測器作為標準配置。
自動對準以最大化運作時間
傳統繞射儀上更換硬體配置或耗材時通常依賴售後工程師的操作，導致成本高昂、耗時費力。SmartLab SE 採用自動對準的光學系統，從X光管高度校準到單色器對準，全流程都由電腦自動控制完成。這一功能顯著減少了停機時間，降低了了總體持有成本，並確保儀器始終處於最佳工作狀態。
SmartLab SE 功能
SmartLab SE 影片
SmartLab SE 技術規格
| 技術原理 | X 光繞射（XRD） | |
|---|---|---|
| 應用場景 | 粉末繞射、薄膜繞射、小角度散射（SAXS）、極圖、殘餘應力和非環境原位實驗 | |
| 儀器類型 | 內建智慧引導系統的多功能θ-θ X 光繞射儀 | |
| 標準配置 | 3 kW 密封 X 光管 D/teX Ultra 250 矽條偵測器 垂直型 θ-θ 測角儀 |
|
| 選配項目 | 二維 HPAD偵測器HyPix-400 | |
| 控制系統 | 外置PC、MS Windows 操作系統、SmartLab Studio II 軟體 | |
| 尺寸 | 1270（寬）×1880（高）×1220（深）mm | |
| 整機重量 | 約 800 公斤（核心零件） | |
| 電源要求 | 三相： 200 V AC 50/60 Hz 30 A 單相： 220-230 V AC 50/60 Hz 40 A |
|
SmartLab SE 選配項目
本產品可選配以下配件：
Solid-State Battery Cell Attachment
Enables In Operando XRD analysis of a complete and functioning rechargeable solid-state cell.
Liquid Electrolyte Cell Attachment
Holds the individual components of a battery (anode, cathode, liquid electrolyte, etc.) to form a working rechargeable cell.
Laminate/Pouch Cell Attachment
Holds a laminate/pouch type rechargeable cell for In Operando XRD analysis.
Coin Cell Attachment - Reflection
Holds a coin cell horizontally for reflection geometry X-ray beam for In Operando XRD analysis.
Coin Cell Attachment - Transmission
Holds a coin cell vertically for transmission geometry X-ray beam for In Operando XRD analysis.
SmartLab SE 應用說明
以下應用說明與本產品相關
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XRD2001 - Orientation and Residual Stress Evaluation in Metal Thin Films
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BATT1012 - Inference of Valence and Li Ion Diffusion Path Using the BVS Method
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BATT1011 - Measurement of Cathode Material NCM Using XSPA-400 ER High-Energy Resolution Detector
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BATT1010 - Investigation of Phase Transition Behavior upon Cathode Material NCM Firing
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BATT1001 - Qualitative Analysis of Impurities (Sulfate) in Mixed Nickel-Cobalt Sulfide
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PHRM0002 - In-Situ DSC-Humidity PXRD Analysis for Pharmaceuticals
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BATT0001 - Battery Material Development
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B-XRD1129 - Variable Humidity Measurement of a Drug Substance using XRD-DSC and a Humidity Controller
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B-XRD1001 - Quantitative Analysis of a 4-component Sample
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B-XRD1111 - Quantitative Analysis of 3-component Sample by DD method
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B-XRD1002 - Quantification of a 4-component Sample using RIR method
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B-XRD1103 - Phase Identification of a Coarse-grained Trace Component in a Mineral Powder using 2D XRD
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B-XRD1021 - Phase Changes of Pharmaceuticals as a Function of Temperature and Humidity
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B-XRD1020 - Observation of Dehydration Process of Hydrate by XRD-DSC
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B-XRD1128 - Observation of Dehydration Behavior of a Drug Substance using TG-DTA and XRD-DSC
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B-XRD1117 - Observation of a Phase Transition at High Temperature under Various Atmospheres
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B-XRD1023 - Measurement of Pseudo-polymorph Impurities in Tablets
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B-XRD1113 - Evaluation of Oxidation State by the BVS Method
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B-XRD1150 - Evaluation of Graphitization Degree of Lithium-ion Battery Carbon Anode Material by X-ray Diffractometry
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B-XRD1149 - Evaluation of Barium Titanate Polymorphs by Rietveld Analysis
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B-XRD1018 - Crystallite Size Distribution of Zinc Oxide Nanoparticles
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B-XRD2025 - Analysis of Uniaxially Oriented Film by Wide-range RSM
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B-XRD2026 - Analysis of Epitaxial Films on In-plane Anisotropic Substrates by Wide-Range RSM
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B-XRD1172 - Phase Identification and Quantitative Analysis of Rare Earth Ore by X-ray Diffraction
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B-XRD1168 - Phase identification and Quantitative Analysis of Nickel Ore by X-ray Diffraction
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B-XRD1166 - Phase Identification and Quantitative Analysis of Copper Ore by X-ray Diffraction
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B-XRD1165 - Phase Identification and Quantitative Analysis of Iron Ore by X-ray Diffraction
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XRD1014 - Ab-initio Crystal Structure Determination of a Cu-MOF Using Powder Diffraction Data Obtained from a Benchtop X-ray Diffractometer
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B-XRD1155 - Detection of trace components in battery cathode materials using a seamless pixel array detector
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B-XRD1148 - Composition ratio classification of ternary cathode material by cluster analysis
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B-XRD1143 - Verifying the Validity of Crystallite Sizes Determined by the FP Method
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B-XRD1076 - Rietveld Quantitative Analysis of Trace Components in Cement
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B-XRD1119 - Quantitative Characterization of Polymer film by Orientation Function
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B-XRD1115 - Quantitative Analysis of γ-Al₂O₃ by the DD Method
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B-XRD1142 - Quantitative Analysis of Crystal Polymorphs by the DD Method
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B-XRD1093 - Quantitative Analysis of Amorphous Components in Cement
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B-XRD1125 - Quantification of the Taste of Salt by DD (Direct Derivation) Method
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B-XRD1146 - Quantification of Blast Furnace Slag by Rietveld Refinement using Reference Intensity Ratio
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B-XRD1121 - Phase Identification of Mixed Powder by Real-time Analysis
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B-XRD1030 - Particle Diameter Distribution of Gold Nanoparticles
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B-XRD1060 - MiniFlex Measurement of Trace Samples
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B-XRD1063 - Measurement of a Film Sample
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B-XRD1114 - LOQ of Trace Impurities in API by the DD Method
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XRD1003 - How to Evaluate Solid Pharmaceutical Drugs (3): Confirming Hydrates
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XRD1002 - How to Evaluate Solid Pharmaceutical Drugs (2): Confirming the Presence/absence of Amorphous Substances
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XRD1001 - How to Evaluate Solid Pharmaceutical Drugs (1): Confirming the crystal form of an API
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B-XRD1101 - High-T analysis - MiniFlex with HyPix-400 MF / BTS 500
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B-XRD1105 - High-speed in-situ Measurement of Melting Process of Metal
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B-XRD1147 - High-precision Quantitative Analysis of Clinker Mineral Polymorphs by Rietveld Refinement
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B-XRD3005 - Evaluation of Residual Stress of Thin Films by GI-XRD and the Multiple hkl Method
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B-XRD1104 - Evaluation of Grain Condition and Orientation of Cemented carbide using 2D XRD
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B-XRD1078 - Evaluation of Crystallite Size and Pore Size distribution of Fuel Cell Materials
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B-XRD1071 - Crystallite Size Analysis of a Catalyst Material by the Scherrer Method
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B-XRD1014 - Crystal Orientation Analysis of Rolled Sheet Material by Pole Figure Measurement
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B-XRD1009 - Charging-discharging of Cathode Materials in Li-ion Batteries
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B-XRD1106 - Charge/discharge Process of Li-ion Battery Positive Electrode
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B-XRD1127 - Background Reduction for Iron Oxide with CuKα X-rays using XRF Mode
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B-XRD1141 - Observation of time-dependent hydration reaction by X-ray diffractometry
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B-XRD1140 - Accurate and Highly Precise Quantitative Analysis of Cement Samples using Rietveld Refinement
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B-XRD1011 - Temperature Dependence of a Lattice Constant
SmartLab SE 資源
網路研討會
| X光繞射技術在電池研究中的應用 | 觀看錄音 |
| 如何在進行原位（operando）XRD 實驗 | 觀看錄音 |
| 何時使用 XRD 以及如何為鋰離子電池研究設定實驗 | 觀看視頻 |
| 同步XRD-DSC - 整合兩者技術，發揮更大效益 | 觀看記錄 |
| 製藥領域中的成分分析和無標樣定量分析 | 觀看記錄 |
| X 光繞射 (XRD) 在石棉和可吸入二氧化矽中的深度應用綜述 | 觀看錄音 |
| 製藥領域中的粉末 X 光繞射 (XRD)應用 | 觀看記錄 |
| 難溶性藥物溶出速率的提升 - X 光繞射在藥物製劑開發中的關鍵作用 | 觀看記錄 |
| XRD-DSC 合併使用技術在製藥領域的應用研究 | 觀看影片 |
| 化學計量學與統計分析在 X 光繞射數據中的應用：定量分析與批次放行標準 | 觀看記錄 |
| SmartLab Studio II 軟體中Part 11合規性功能解析 | 觀看錄音 |
| Rietveld精修法中的繞射光譜圖分析 | 觀看錄音 |
理學期刊文章
 基於全散射譜原子尺度結構分析 |
閱讀文章 |
| 水泥材料的定量分析 |
閱讀文章 |
| 粉末 X 光繞射基礎課程第四講：定性分析 |
閱讀文章 |
| 粉末 X 光繞射中多維測量的應用 |
閱讀文章 |
| 整合 X 光繞射軟體 -- SmartLab Studio II |
閱讀文章 |
| 全自動多功能 X 光繞射儀 - SmartLab SE |
閱讀文章 |
SmartLab SE 活動
在以下活動中深入了解我們的產品
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活動日期地點活動網站
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Eastern Analytical Symposium (EAS) 20262026年11月16日 - 2026年11月18日New Jersey
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MATERIAUX 20262026年11月16日 - 2026年11月20日Grenoble, France
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German Epitaxy Workshop2026年11月25日 - 2026年11月27日Freiburg, Germany
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MRS Fall 20262026年11月29日 - 2026年12月4日Boston, MA, USA
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Advanced Automotive Battery Conf 20262026年12月8日 - 2026年12月11日Las Vegas, NV, USA
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Webinar: Rapid and Sensitive Analysis of Respirable Crystalline Silica with XRD2026年12月16日 - 2026年12月16日Webinar
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Rigaku XRD Forum 2027: Semiconductors, Thin Films & Coatings2027年2月23日 - 2027年2月25日Neu-Isenburg, Germany
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Webinar: Autonomous Labs Are Becoming a Strategic Priority. What Does That Mean for Materials Research?2027年3月10日 - 2027年3月10日Webinar
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Webinar: What It Really Takes to Build an Autonomous Lab2027年4月14日 - 2027年4月14日Webinar
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Webinar: Case Study - Lessons from Building an Autonomous Lab at Georgia Tech2027年5月12日 - 2027年5月12日Webinar
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Webinar: How to Build AI-driven Autonomous Labs across Disparate Interdisciplinary Environments2027年6月9日 - 2027年6月9日Webinar
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Webinar: Designing Automated Sample Synthesis Workflows That Actually Work2027年7月14日 - 2027年7月14日Webinar
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Webinar: Closing the Loop: Machine Learning Workflows for Your Autonomous Lab2027年8月11日 - 2027年8月11日Webinar
SmartLab SE 訓練
即將舉辦的訓練課程
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標題日期費用地點備註課程大綱報名表單
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SmartLab training (EMEA)2027年3月7日 - 2027年3月11日Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
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SmartLab training (EMEA)2027年6月27日 - 2027年7月1日Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
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SmartLab training (EMEA)2027年10月17日 - 2027年10月21日Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
