SmartLab
配備引導軟體的多功能自動化 X光繞射儀（XRD）
粉末繞射、薄膜表徵、小角度散射（SAXS）、面內散射與原位（operando）測量
理學 SmartLab 是目前最卓越的高解析度X光繞射儀（XRD）。其最顯著的特點在於全新的 SmartLab Studio II 軟體 。該軟體搭載了智慧用戶引導專家系統，能逐步引導操作人員完成複雜的實驗流程，宛如一位資深專家相伴在側，幫助您從容應對各類分析挑戰。
SmartLab 概覽
新型SmartLab X光繞射系統整合高通量 9 kW旋轉陽極 X光源 PhotonMax，與高能量解析度二維半導體偵測器 HyPix-3000，後者支援 0D/1D/ 2D多模式測量，可透過單個偵測器對應所有應用領域，避免為了不同應用領域而需準備和切換多偵測器的複雜操作。HyPix-3000 偵測器可用於獲得二維粉末繞射圖譜，利用全維度訊息，實現高精度的定性分析。該系統內置高解析度 θ/θ 閉環測角儀驅動系統，可選配面內繞射臂。該系統配備新一代的交叉光束光學元件（CBO）系列全自動切換反射/透射的光學元件（CBO-Auto）。
專為實用性而設計的 XRD
SmatLab結合了電腦控制的對準系統與全自動光學系統，並在 SmartLab Studio II 軟體中內建了智慧用戶引導功能，達到硬體模式的便捷切換，確保複雜的硬體不會阻礙您的研究。
重新定義功能的 XRD
無論您研究的是薄膜、奈米材料、粉末還是液體，SmartLab 均能為您提供所需的 XRD 測量功能。該設備支援粉末、液體、薄膜以及紡織品等多種樣品的測試，並支援樣品的選區分析。全新的SmartLab Studio II整合軟體平台涵蓋了從測量到分析的全部功能，用戶可輕鬆完成實時原位（Operando）測試。此外，系統內建嚴格的安全驗證協議，確保軟硬體零件符合 FDA 21 CFR Part 11（美國電子記錄與電子簽名法規）等監管標準。
SmartLab 功能
SmartLab 影片
SmartLab 技術規格
| 技術原理 | X光繞射 (XRD) | |
|---|---|---|
| 應用領域 | 粉末繞射、薄膜表徵、小角度散射（SAXS）、面內散射、原位（Operando）測試 | |
| 儀器類型 | 全自動高解析度 θ-θ 型多功能 X光繞射儀XRD (配備專家系統引導軟體) | |
| 標準配置 | 3 kW密封 X光管 CBO 光學系統 D/teX Ultra 250 矽條偵測器 |
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| 選配項目 | 高通量 9 kW旋轉陽極 X光源PhotonMax 面內繞射臂（五軸測角儀） 高能量解析度二維 HPAD 偵測器HyPix-3000 Johansson Kα₁ 單色化光學元件 |
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| 控制系統 | 外置PC、MS Windows 操作系統、SmartLab Studio II 軟體 | |
| 尺寸 | 1300（寬）×1880（高）×1300（深）mm | |
| 整機重量 | 密封管：約 750 公斤 密封管：約 750 公斤 |
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| 電源要求 | 密封管：單相, 200-230 V 50/60 Hz, 40 A 或 三相 200 V 50/60 Hz, 30 A 旋轉陽極：三相， 200 V 50/60 Hz, 60 A |
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SmartLab 選配項目
本產品可選配以下配件：
Solid-State Battery Cell Attachment
Enables In Operando XRD analysis of a complete and functioning rechargeable solid-state cell.
Liquid Electrolyte Cell Attachment
Holds the individual components of a battery (anode, cathode, liquid electrolyte, etc.) to form a working rechargeable cell.
Laminate/Pouch Cell Attachment
Holds a laminate/pouch type rechargeable cell for In Operando XRD analysis.
Laminate/Pouch Cell - XY Attachment
Holds a laminate/pouch type rechargeable cell for In Operando XRD analysis combined with XY mapping
Coin Cell Attachment - Reflection
Holds a coin cell horizontally for reflection geometry X-ray beam for In Operando XRD analysis.
Coin Cell Attachment - Transmission
Holds a coin cell vertically for transmission geometry X-ray beam for In Operando XRD analysis.
SmartLab 應用說明
以下應用說明與本產品相關
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B-XRD2038 - Full-wafer Mapping Evaluation of Metal Films on an 8-inch Wafer using the Rθ Attachment
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B-XRD2039 - Observation of Anisotropic and Nonlinear Thermal Expansion of Thin Films on Substrates by In-Plane X-ray Diffraction
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BATT1018 - XRD Measurement with Temperature Control and Charge/Discharge Using Laminated Cells
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BATT1017 - XRD Measurement during Charge/Discharge Using All-Solid-State Batteries
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BATT1016 - XRD Measurement During Charge/Discharge Using Laminated Cell Batteries
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BATT1015 - Local Structure Analysis of Li₃PS₄ Solid-State Electrolyte
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BATT1012 - Inference of Valence and Li Ion Diffusion Path Using the BVS Method
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BATT1011 - Measurement of Cathode Material NCM Using XSPA-400 ER High-Energy Resolution Detector
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BATT1010 - Investigation of Phase Transition Behavior upon Cathode Material NCM Firing
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PHRM0002 - In-Situ DSC-Humidity PXRD Analysis for Pharmaceuticals
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BATT0002 - Battery Material Characterization
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BATT0001 - Battery Material Development
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B-XRD1155 - Detection of trace components in battery cathode materials using a seamless pixel array detector
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B-XRD1143 - Verifying the Validity of Crystallite Sizes Determined by the FP Method
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B-XRD1129 - Variable Humidity Measurement of a Drug Substance using XRD-DSC and a Humidity Controller
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B-XRD2034 - Twist Width Evaluation of Group III-V Nitride Films by Rocking Curve Measurement
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B-XRD1109 - Structure Determination of Ferroelectric Nano-powder by PDF Analysis
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B-XRD1131 - Structural Characterization of Zeolite by PDF Analysis
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B-XRD1136 - Structural Characterization of Zeolite by Electron Density Analysis
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B-XRD1112 - Structural Analysis of Amorphous Silica by PDF Analysis
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B-XRD1123 - Simultaneous Operando XRD Measurement for Positive and Negative Electrode Materials
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B-XRD1080 - Rietveld Analysis of Battery Material using a Mo Source
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B-XRD1118 - Quick Pole Figure Measurement of a Metal Material using 2DD
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B-XRD1119 - Quantitative Characterization of Polymer film by Orientation Function
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B-XRD1120 - Quantitative Analysis of Pharmaceutical Polymorphic Forms via the DD Method
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B-XRD1115 - Quantitative Analysis of γ-Al₂O₃ by the DD Method
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B-XRD1132 - Quantitative Analysis of Glass with the DD Method
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B-XRD1142 - Quantitative Analysis of Crystal Polymorphs by the DD Method
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B-XRD1001 - Quantitative Analysis of a 4-component Sample
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B-XRD1111 - Quantitative Analysis of 3-component Sample by DD method
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B-XRD1125 - Quantification of the Taste of Salt by DD (Direct Derivation) Method
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B-XRD1002 - Quantification of a 4-component Sample using RIR method
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B-XRD1043 - Powder Crystal Structure of Organic Crystals
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B-XRD1121 - Phase Identification of Mixed Powder by Real-time Analysis
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B-XRD2023 - Phase Identification of an Organic Thin Film by GIWAXS Measurement with a 2D detector
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B-XRD1103 - Phase Identification of a Coarse-grained Trace Component in a Mineral Powder using 2D XRD
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B-XRD2020 - Phase ID and Orientation Analysis for Thin Film SOFC Material using 2DD
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B-XRD1137 - Phase ID Analysis of Micro-impurities on the Surface of a Tablet by Micro-area XRD Measurements
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B-XRD1021 - Phase Changes of Pharmaceuticals as a Function of Temperature and Humidity
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B-XRD1110 - Particle Size Distribution Analysis of Ferroelectric Nanopowder by USAXS
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B-XRD1102 - Particle Size / Distribution of Pigment Ink by USAXS
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B-XRD1030 - Particle Diameter Distribution of Gold Nanoparticles
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B-XRD2009 - Orientation Analysis of Organic Thin Film on Single Crystal Sub by In-plane XRD
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B-XRD2005 - Orientation Analysis of Organic Thin Film on Rubbed Glass by In-plane XRD
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B-XRD1124 - Operando Transmission XRD Measurement of All-solid-state Lithium-ion Battery using Ag Source
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B-XRD1116 - Operando Measurement of Laminated Lithium-ion Battery using 2DD
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B-XRD2028 - Off-normal Fiber Texture Analysis by Pole Figure Measurement
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B-XRD2032 - Observation of Orientation State of Polypropylene Film Products by 2D-GIWAXS Measurement
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B-XRD1020 - Observation of Dehydration Process of Hydrate by XRD-DSC
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B-XRD1128 - Observation of Dehydration Behavior of a Drug Substance using TG-DTA and XRD-DSC
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B-XRD1026 - Observation of Crystallization Behavior of Ionic Liquids by XRD-DSC
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B-XRD1135 - Observation of Butter Crystal by Simultaneous XRD-DSC Measurement
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B-XRD1117 - Observation of a Phase Transition at High Temperature under Various Atmospheres
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B-XRD1089 - Micro-area Mapping Measurement of Printed Circuit Boards
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B-XRD1023 - Measurement of Pseudo-polymorph Impurities in Tablets
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B-XRD1107 - Material Characterization by PDF and RDF Analysis
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B-XRD2003 - Magnetic Recording Media (FePt) by In-plane XRD
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B-XRD1114 - LOQ of Trace Impurities in API by the DD Method
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XRD1003 - How to Evaluate Solid Pharmaceutical Drugs (3): Confirming Hydrates
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XRD1002 - How to Evaluate Solid Pharmaceutical Drugs (2): Confirming the Presence/absence of Amorphous Substances
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XRD1001 - How to Evaluate Solid Pharmaceutical Drugs (1): Confirming the crystal form of an API
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B-XRD1105 - High-speed in-situ Measurement of Melting Process of Metal
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B-XRD2021 - High-speed RSM of an Epitaxial Film by 1D Detection Mode
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B-XRD2024 - High-speed RSM of a III-nitride Epitaxial Film by 1D Detection Mode
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B-XRD2007 - Examination for Growth Process of Organic Thin Film by In-plane XRD
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B-XRD2030 - Evaluation of Uniformity of Thin Film Thickness by X-ray Reflectivity Mapping
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B-XRD2027 - Evaluation of Uniformity of a Single Crystal Substrate by Rocking Curve Measurement
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B-XRD1122 - Evaluation of the Crystallinity of a Carious Tooth using X-ray Diffraction
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B-XRD3005 - Evaluation of Residual Stress of Thin Films by GI-XRD and the Multiple hkl Method
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B-XRD1113 - Evaluation of Oxidation State by the BVS Method
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B-XRD1150 - Evaluation of Graphitization Degree of Lithium-ion Battery Carbon Anode Material by X-ray Diffractometry
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B-XRD1104 - Evaluation of Grain Condition and Orientation of Cemented carbide using 2D XRD
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B-XRD2031 - Evaluation of Curvature of a Single Crystal Substrate by Rocking Curve Measurement
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B-XRD1078 - Evaluation of Crystallite Size and Pore Size distribution of Fuel Cell Materials
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B-XRD2001 - Evaluation of Crystal Quality (Tilt and Twist Qidths) of Group-III Nitride Film by the Rocking Curve Method
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B-XRD1108 - Direct Observation of Melting and Crystallization of Fresh Cream
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B-XRD1126 - Crystallization of Chocolate Observed by XRD-DSC
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B-XRD1018 - Crystallite Size Distribution of Zinc Oxide Nanoparticles
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B-XRD1035 - Crystal Structure Analysis of a Powder Sample of Pharmaceutical Cocrystals by the Rietveld Method
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B-XRD1046 - Crystal Phase Identification of Pharmaceutical Materials in the Freeze Drying Process
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B-XRD1044 - Crystal Phase Identification of Carbide Tips by Micro-area 2D X-ray Diffraction
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B-XRD2006 - Crystal Orientation Evaluation of Epitaxial Film and Ultrathin Buffer Layers by In-plane Reciprocal Space Mapping
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B-XRD1014 - Crystal Orientation Analysis of Rolled Sheet Material by Pole Figure Measurement
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B-XRD2022 - Crystal Defect Analysis by X-ray Reflection Topography
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B-XRD1009 - Charging-discharging of Cathode Materials in Li-ion Batteries
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B-XRD1106 - Charge/discharge Process of Li-ion Battery Positive Electrode
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B-XRD1139 - Calculation of Molecular Stacking Spacing of Copper Phthalocyanine using PDF Analysis
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B-XRD2025 - Analysis of Uniaxially Oriented Film by Wide-range RSM
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B-XRD2026 - Analysis of Epitaxial Films on In-plane Anisotropic Substrates by Wide-Range RSM
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B-XRD1141 - Observation of time-dependent hydration reaction by X-ray diffractometry
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B-XRD1011 - Temperature Dependence of a Lattice Constant
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B-XRD1168 - Phase identification and Quantitative Analysis of Nickel Ore by X-ray Diffraction
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B-XRD1166 - Phase Identification and Quantitative Analysis of Copper Ore by X-ray Diffraction
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B-XRD1165 - Phase Identification and Quantitative Analysis of Iron Ore by X-ray Diffraction
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XRD1014 - Ab-initio Crystal Structure Determination of a Cu-MOF Using Powder Diffraction Data Obtained from a Benchtop X-ray Diffractometer
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XRD2001 - Orientation and Residual Stress Evaluation in Metal Thin Films
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XRD1161 - MiniFlex XpC for Clinker Application
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XRD1160 - Fast Analysis of Mineralogical Phases in Blended Cements using Miniflex XpC
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B-XRD1148 - Composition ratio classification of ternary cathode material by cluster analysis
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B-XRD1076 - Rietveld Quantitative Analysis of Trace Components in Cement
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B-XRD1081 - Quantitative Analysis of Polymorphic Impurities in a Drug Substance by the Calibration Method
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B-XRD1093 - Quantitative Analysis of Amorphous Components in Cement
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B-XRD1146 - Quantification of Blast Furnace Slag by Rietveld Refinement using Reference Intensity Ratio
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B-XRD1060 - MiniFlex Measurement of Trace Samples
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B-XRD1063 - Measurement of a Film Sample
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B-XRD1101 - High-T analysis - MiniFlex with HyPix-400 MF / BTS 500
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B-XRD1147 - High-precision Quantitative Analysis of Clinker Mineral Polymorphs by Rietveld Refinement
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B-XRD1071 - Crystallite Size Analysis of a Catalyst Material by the Scherrer Method
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B-XRD1127 - Background Reduction for Iron Oxide with CuKα X-rays using XRF Mode
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B-XRD1140 - Accurate and Highly Precise Quantitative Analysis of Cement Samples using Rietveld Refinement
SmartLab 資源
網路研討會
| 電池研究中的 X光繞射測量 |
觀看錄音 |
| 用於日常電池分析的配對分佈函數 (PDF) 分析 | 觀看記錄 |
| 如何在操作中實行 XRD 實驗 | 觀看影片 |
| 全繞射和非晶材料特性分析 | 觀看影片 |
| 何時使用 XRD 以及如何為鋰離子電池研究設定實驗 | 觀看影片 |
| 同步 XRD-DSC - 總和遠遠大於部分 | 觀看記錄 |
| 製藥應用中的成分分析和無標準定量分析 | 觀看記錄 |
| 在石棉和可吸入矽調查中使用 X光繞射 (XRD) 的深入概述 | 觀看影片 |
| 用於半導體材料的 Smartlab XRD 解決方案 | 觀看記錄 |
| 電池材料的 X光分析解決方案介紹 | 觀看影片 |
| 使用原子對分佈函數分析驗證非晶和非晶體系的分子結構 | 觀看錄像 |
| 用於製藥的粉末 X 光繞射 (XRD) | 觀看記錄 |
| 提高水溶性差藥物的溶出率--X光繞射在藥物製劑開發中的作用 | 觀看記錄 |
| 製藥中的 XRD-DSC 組合 | 觀看影片 |
| 化學計量和統計分析技術在 X光繞射數據中的應用：定量分析和批次釋放 | 觀看記錄 |
| SmartLab Studio II 中符合Part 11要求的功能介紹 | 觀看錄音 |
| 關於里特沃爾德精修法中的繞射X光輪廓 | 觀看錄音 |
理學雜誌文章
造訪理學期刊資源頁面 ，獲得與SmartLab相關的文章。
刊物
造訪刊物圖書館 ，獲得與 SmartLab 相關的文章
SmartLab 活動
在以下活動中深入了解我們的產品
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活動日期地點活動網站
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AAPS PharmSci 360 - 20262026年10月25日 - 2026年10月28日New Orleans, LA, USA
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Conférence GDR MATEPI2026年11月2日 - 2026年11月6日Nice, France
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SERMACS 20262026年11月4日 - 2026年11月7日Memphis, TN, USA
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34th Leoben-Conference on Polymer Engineering and Science2026年11月5日 - 2026年11月6日Leoben, Austria
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IWN2026（International Workshop on Nitride Semiconductors 2026）2026年11月8日 - 2026年11月13日Kumamoto, Japan
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SEMICON Europa2026年11月10日 - 2026年11月13日Munich, Germany
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Webinar: Integrate Analytical Instruments into Your Self-driving Lab2026年11月11日 - 2026年11月11日Webinar
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Eastern Analytical Symposium (EAS) 20262026年11月16日 - 2026年11月18日New Jersey
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MATERIAUX 20262026年11月16日 - 2026年11月20日Grenoble, France
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German Epitaxy Workshop2026年11月25日 - 2026年11月27日Freiburg, Germany
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MRS Fall 20262026年11月29日 - 2026年12月4日Boston, MA, USA
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Advanced Automotive Battery Conf 20262026年12月8日 - 2026年12月11日Las Vegas, NV, USA
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SEMICON Japan 20262026年12月9日 - 2026年12月11日Tokyo, Japan
SmartLab 訓練
即將舉辦的訓練課程
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標題日期費用地點備註課程大綱報名表單
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SmartLab training (EMEA)2027年3月7日 - 2027年3月11日Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
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SmartLab training (EMEA)2027年6月27日 - 2027年7月1日Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
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SmartLab training (EMEA)2027年10月17日 - 2027年10月21日Please contact ECOE@rigaku.comNeu-Isenburg, GermanySmartLab training (EMEA)
