XSPA-400 ER high energy resolution pixel detector capable of 0, 1, and 2D measurements Read more about XSPA-400 ER
Visualization of components in ceramic composites using a high-resolution 3D X-ray microscope AppNote XRI1007: Visualization of components in ceramic composites using a high-resolution 3D X-ray microscope
Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM AppNote B-XRD2026: Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM
Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM AppNote B-XRD2026: Analysis of epitaxial films on in-plane anisotropic substrates by wide-range RSM
Structural analysis of amorphous silica by PDF analysis AppNote B-XRD1112: Structural analysis of amorphous silica by PDF analysis
Structural characterization of zeolite by PDF analysis AppNote XRD1131: Structural characterization of zeolite by PDF analysis
Verifying the validity of crystallite sizes determined by the FP method AppNote B-XRD1143: Verifying the validity of crystallite sizes determined by the FP method
Evaluation of barium titanate polymorphs by Rietveld analysis AppNote XRD1149: Evaluation of barium titanate polymorphs by Rietveld analysis