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X-ray topography (XRT)

Newly developed, unique XRT tool to revolutionize semiconductor material defect characterization techniques

2021-08-03

A unique XRT tool was installed recently at Fraunhofer IISB to revolutionize state-of-the-art semiconductor material defect characterization techniques. Rigaku Corporation and Fraunhofer IISB have built the Center of Expertise for X-ray Topography in Erlangen to support the semiconductor industry

The June edition of The Bridge, the Materials Science newsletter from Rigaku, is now online

2020-06-25

Issue 84 of The Bridge newsletter from Rigaku focuses on materials science and is available from the company’s website

June 25, 2020 – The Woodlands, Texas. The June 2020 edition of The Bridge newsletter from Rigaku Corporation is now available on the company’s global website. The Bridge focuses

TOPIQ | Investigating crystalline defects of semiconductors using X-ray Topography

Join this webinar to discover the X-ray Topography methodology, the scientific principles of measurements and the possibilities of the instrumentation. The webinar will focus on applications on different materials and the results, demonstrating how the XRTmicron system is used to get highest quality 2D and 3D topograms of semiconductor material. 
Date/time
Date/Time
Presenter
Martin Fehrentz

Gulf Coast Conference (GCC 2021)

The Gulf Coast Conference is a non-profit organization for the advancement of knowledge in Chemical Analysis Technology associated with Petrochemical, Refining, and Environmental fields.

Galveston, TX
October 12th, 2021 - October 13th, 2021
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