Abstract
Rigaku launched a high-speed X-ray topography system with the improved throughput of 10–20 wafers/hour (3–6 min/wafer). High-speed image acquisition
A unique XRT tool was installed recently at Fraunhofer IISB to revolutionize state-of-the-art semiconductor material defect characterization techniques. Rigaku Corporation and Fraunhofer IISB have built the Center of Expertise for X-ray Topography in Erlangen to support the semiconductor industry
Issue 84 of The Bridge newsletter from Rigaku focuses on materials science and is available from the company’s website
June 25, 2020 – The Woodlands, Texas. The June 2020 edition of The Bridge newsletter from Rigaku Corporation is now available on the company’s global website. The Bridge focuses
One of the major technical challenges of this decade are energy efficient technologies, which is among others, comparable in its
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