Evaluation of residual stress of thin films by GI-XRD and the multiple hkl method
AppNote B-XRD3005: Evaluation of residual stress of thin films by GI-XRD and the multiple hkl method
Rapid data acquisition with the world’s smallest stress analyzer
X-ray stress measurement permits the non-destructive measurement of residual stress, primarily
Weight saving is an important challenge for various industries, including transportation (automotive, aeronautical, or bullet-train manufacturing), electronic devices, and intelligent
This paper discusses recent methods in X-ray stress analysis. The authors have selected three examples thought to be the most