HyPix-3000
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers
Diffraction-based characterization of epitaxial thin films, such as the measurement of the composition, strain, and lattice constants, requires complicated alignment
It is necessary to obtain high-quality data for highly accurate analysis. The characteristics of high-quality data may be high intensity
Although high-resolution X-ray diffraction (HR-XRD) has been commonly employed for the crystallinity characterization of GaN-related materials, special care is required