Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples
High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer
Ultra-trace elemental surface contamination metrology by TXRF with VPD capability; up to 300 mm wafers