SmartLab SE

Multipurpose X-ray Diffraction System with Built-In Intelligent Guidance

Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments

The SmartLab SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and advanced photon counting hybrid pixel array detectors (HPAD).

SmartLab SE Overview

SmartLab Studio II incorporates a built-in Guidance expert system that suggests the optimal hardware configuration and settings for specific application measurements. The software will determine which optics are most appropriate for a given application, determine the instrument settings and execute the measurement, delivering a completely automated measurement sequence. Since the SmartLab SE has built-in component recognition, Guidance will not only tell you how you should configure the SmartLab SE for a given measurement, it will also warn you if you have not configured it properly. Expert advice coupled with hardware that will confirm the correct configuration is the foundation of the SmartLab SE platform.

HyPix-400: next generation 2D detector

With the SmartLab SE, Rigaku introduces the available HyPix-400, a semiconductor hybrid pixel array detector that was specifically designed for multipurpose X-ray diffractometers. Its large active area, high angular resolution and ultra-high dynamic range make it the perfect, affordable, 2D detector solution for a large variety of applications, including powder and thin film diffraction. Please note that the D/teX Ultra 250 silicon strip detector is also available as a standard detector choice if desired.

Automatic alignment for maximized uptime

Changing hardware configurations or consumables on some diffractometers is so daunting that people often invite their service engineer to perform the task. This can be costly and time consuming. The optics configuration on the SmartLab SE is self-aligning. From the tube height to the monochromator alignment, all of the optical alignment is done automatically under computer control. This feature drastically reduces down time and cost of ownership of the instrument, and it allows you to be confident that your instrument will always be in an aligned condition.

SmartLab SE Features

SmartLab Studio II software based on a new architecturally integrated modular platform
Cross-beam optics module switches between Bragg-Brentano and parallel beam without the need to change optics
HyPix-400 2D detector enables seamless switch between 0D, 1D and 2D detection mode depending on application type
D/teX Ultra 250 1D detector accelerates powder diffraction by a factor of 250 in speed and provides adjustable energy resolution of approximately 20% or 4% depending on sample type
Integrated intelligent Guidance software enables fully automated measurement including optics and sample alignment
Self-aligned optics maximize instrument uptime and minimize cost of ownership

SmartLab SE Videos

SmartLab SE Specifications

Technique X-ray diffraction
Benefits Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments
Technology Multipurpose θ-θ X-ray diffractometer with built-in intelligent Guidance
Attributes 3 kW sealed X-ray tube
D/teX Ultra 250 silicon strip detector
Vertical type θ-θ geometry
Options HyPix-400 (2D HPAD) detector
Computer External PC, MS Windows OS, SmartLab Studio II software
Dimensions 1270 (W) x 1880 (H) x 1220 (D) mm
Mass Approx. 800 kg (core unit)
Power requirements 3Ø, 200 VAC 50/60 Hz 30 A or
1Ø, 220-230 VAC 50/60 Hz 40 A

SmartLab SE Options

SmartLab SE Application Notes

The following application notes are relevant to this product

SmartLab SE Resources


X-ray Diffraction Measurements for Battery Research Watch the Recording
How to Run in Operando XRD Experiments Watch the Recording
When to Use XRD and How to Set Up Experiments for Li-ion Battery Research Watch the Recording
Simultaneous XRD-DSC – The sum Is Much Greater than the Parts Watch the Recording
Component Analysis and Standardless Quantitative Analysis for Pharmaceutical Applications Watch the Recording
In-Depth Overview of the Use of X-ray Diffraction (XRD) in the Investigation of Asbestos and Respirable Silica Watch the Recording
Powder X-ray Diffraction (XRD) for Pharmaceuticals Watch the Recording
Dissolution Rate Enchancement of Poorly Water Soluble Drugs - Role in XRPD in the Pharmaceutical Formaulation Development Watch the Recording
Combined XRD-DSC for Pharmaceuticals Watch the Recording
The Application of Chemometric and Statistical Analysis Techniques for X-ray Diffraction Data: Quantitative Analysis and Lot Release Watch the Recording
Introduction of Part 11 Compliant Features in SmartLab Studio II Watch the Recording
On the Diffraction Line Profiles in the Rietveld Method Watch the Recording

Rigaku Journal articles

adobeAtomic-Scale Structural Analysis by Total Scattering Profiles Read the Article
adobeQuantification analysis of cement materials Read the Article
adobePowder X-ray Diffraction Basic Course Fourth Installment: Qualitative analysis Read the Article
adobeUse of multi-dimensional measurement in powder X-ray diffraction Read the Article
adobeIntegrated X-ray diffraction software -- SmartLab Studio II Read the Article
adobeAutomated multipurpose X-ray diffractometer - SmartLab SE Read the Article

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