- Extremely high performance due to bright source, noise-free X-ray detector and fast goniometer speeds
- Continuously variable divergence slit option lets you resolve reflections from long unit cells.
- Minimal downtime with longer X-ray tube lifetime - supported by online diagnostics and troubleshooting
- Compact design to fit in your laboratory
Single or dual microfocus X-ray diffractometer for all your crystallography needs
A fast and agile single crystal X-ray diffractometer for small molecule 3D structure analysis
With your success utmost in our minds, we have developed the XtaLAB Synergy-S X-ray diffractometer for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy-S produces fast, accurate data in an intelligent fashion. The system is based around the PhotonJet-S series of microfocus X-ray sources that optionally incorporate continuously variable divergence slits. These third generation sources have been designed to maximize X-ray photons at the sample by using a combination of new optics, new, longer life tubes and an improved alignment system. PhotonJet-S sources are available in Cu, Mo or Ag wavelengths in either a single or dual source configuration. The XtaLAB Synergy-S single crystal X-ray diffractometer comes with kappa goniometer that incorporates fast motor speeds and a unique telescopic two-theta arm to provide total flexibility for your diffraction experiment. The system is also equipped with your choice of HPC digital X-ray photon counting detector, including the HyPix-Arc 150°, HyPix-6000HE or EIGER 1M.
|Product name||XtaLAB Synergy-S|
|Technique||Single crystal X-ray diffraction|
|Benefit||3D structural analysis of molecules|
|Technology||Single crystal X-ray diffractometer|
|Core attributes||Single or dual X-ray source diffractometer with hybrid pixel array detector and kappa goniometer|
|Core options||Oxford Cryostream Cooler and XtalCheck-S|
|Computer||External PC, MS Windows® OS|
|Core dimensions||1300 (W) x 1875 (H) x 850 (D) mm|
|Mass||550 kg (core unit)|
|Power requirements||1Ø, 90-130V 15A or 180-260V 4A|
The ELement ANalyzer is a state-of-the-art attachment that allows us to obtain qualitative information on elements in a single crystal at the same time as X-ray diffraction data collection for a single crystal structural analysis. By measuring the X-ray fluorescence spectrum emitted during X-ray diffraction experiments with the ELement ANalyzer, it becomes possible to perform elemental analysis on a single grain of crystal. The ELement ANalyzer can be used for confirmation the presence of central metal(s) in a mononuclear or polynuclear complex or solvent in a crystal for small molecule X-ray crystallography. There is a broad range of possible applications of the ELement ANalyzer in scientific fields.
The Oxford Cobra is the non-liquid nitrogen Cryostream. Combining the efficiency of a Cryostream with the advantages of a non-liquid system, the Cobra offers the ultimate solution for both macromolecular and small molecule crystallography.
The 800 Series Cryostream is the most robust, efficient and user-friendly liquid nitrogen based low temperature system available today. Specific features include a superior laminar flow system, meaning virtually zero risk of icing, extremely quiet running and a fast-start system resulting in a cool-down time to 100K of just 20 minutes.
The XtalCheck system includes software that facilitates both visual and diffraction imaging of crystallization experiments. With the XtalCheck system, one can easily survey many crystallization experiments by eliminating the need to harvest and cryo-cool samples. Moreover, one can perform serial crystallography experiments, by collecting data from multiple crystals, to achieve complete data sets that can be used for structure solution.