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Winter 2015, Volume 31, No. 1

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Winter 2015 Volume 31, No. 1

The Nobel prize in physics 2014

Katsuhiko Inaba

Incandescent light bulbs lit the 20th century but the 21st century will be lit by LED lamps—thanks to discoveries recognized by the Swedish Academies of Science

On October 7th, 2014, the Royal Swedish Academy of Sciences announced that the 2014 Nobel Prize in Physics will be awarded to the three...

Applications of the two-dimensional detector HyPix-3000 in X-ray diffractometry

Atsushi Ohbuchi

Various types of detectors have previously been used in X-ray diffractometers(1). Scintillation counters (SC) have been used as zero-dimensional (0D) detectors, position-sensitive proportional counters (PSPC) and semiconductor detectors as one-dimensional (1D) detectors, and devices such as imaging plates (IP) and CCD detectors as two-dimensional (2D) detectors. IP and CCD detectors are 2D detectors still in use today, but...

A primer on the use of the nano3DX high-resolution X-ray microscope

Yoshihiro Takeda and Kensaku Hamada

The nano3DX is an X-ray microscope with submicron spatial resolution, employing a quasi-parallel beam, near-detector system comprised of a unique high-intensity X-ray source and a high-resolution X-ray detector. By selecting the X-ray energy to that is most appropriate for the sample, the instrument is capable of observing the microstructure of various samples such as pharmaceuticals, biological tissues...

Sample preparation for X-ray fluorescence analysis III. Pressed and loose powder methods

Gakuto Takahashi

There are two main sample preparation techniques for measurement of powders with XRF—pressed and loose powder methods—neither requiring any chemical processes. In either case the proper sample preparation and accessories need to be selected to prevent breakage of the pressed powder during measurement. When a thin film for analysis surface...

Portable stress analyzer SmartSite RS

Rapid data acquisition with the world’s smallest stress analyzer

X-ray stress measurement permits the non-destructive measurement of residual stress, primarily in the surfaces of metallic components or structures, and is a common measurement method for material strength, lifetime prediction and other estimations in the industrial field.

However, applications have been...

Structure analysis program package CrystalStructure

CrystalStructure is a small molecule structure analysis software package which provides every procedure necessary in a single crystal X-ray structure analysis from determining the space group through creating CIF files.

In CrystalStructure, a “Menu bar” and a “Toolbar” are available on the main window. Necessary commands can be executed by...