Akimitsu Nezu, Hitomi Matsuzaka and Ryouichi Yokoyama
This paper discusses recent methods in X-ray stress analysis. The authors have selected three examples thought to be the most practical from among the many X-ray stress measurement and analysis methods other than the conventional sin2 ψ method. The examples of analyses presented here are: (1) residual stress measurement using the multiple-hkl method, (2) residual stress measurement of samples with shear stress in the depth direction, and (3) residual stress measurement and line-broadening of diffraction in samples with fibre texture using the crystallite strain analysis method.