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Forensics and conservation

Forensics

XRD / XRF / RAMAN for substance identification

X-ray analytical methods have a long history as important tools used to investigate and establish facts in criminal or civil courts of law. Law enforcement at local, state, national, and international levels, as well as customs offices, routinely use X-ray tools to identify, compare or analyze unknown materials. Small spot X-ray fluorescence (XRF) is a non-destructive method that can not only identify and quantify a vast number of atomic elements but also generate area maps of elemental distribution. Common applications include mapping of Pb and Cu residue from bullet holes in clothing, glass chip analysis, ink content and residue analysis. X-ray diffraction (XRD) can identify chemical phases in complete unknowns. For both techniques, quantitative results can be obtained without the use of standards. Rigaku's new Raman spectrometer series are also perfect for chemical or organic materials identification, whether in the lab or in the field.

Progeny ResQ 1064 nm handheld Raman spectrometer provides emergency responders, law enforcement agencies and the military with the industry’s most comprehensive tool for chemical identification, CBRNe detection, and narcotics classification in a fast and simple handheld form. The 1064nm advantage overcomes sample-induced fluorescence interference, allowing operators to identify many real-world compounds (including those that are colored or found in colored packaging) that were previously "invisible" to older generation systems.

Rigaku recommends the following systems:


Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

 The original handheld 1064 nm Raman analyzer to expand incident response by identifying more chemical threats and narcotics

Narcotics-focused analyzer to identify the latest opioid and fentanyl formations

Improved ergonomics for more convenient identification and detection of chemical threats and narcotics – even in non-visible amounts - using the 1064 nm Raman advantage

High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High power, tube above, sequential WDXRF spectrometer

WDXRF spectrometer designed to handle very large and/or heavy samples

High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U

New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

EDXRF spectrometer with powerful Windows® software and optional FP.

Foreign object X-ray inspection instrument

Computed radiography mobile imaging plate scanner

200 kV microcomputerized directional industrial X-ray system

High-speed, stationary sample microtomography of large samples

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

Ultra-high resolution nanotomography using parallel beam geometry

Tube below, single element WDXRF analyzer for quality control applications

Foreign object X-ray inspection instrument

Foreign object X-ray inspection instrument

High-resolution benchtop microtomography of large samples