Analyze raw materials to finished products
The need for chemical analysis of food and cosmetics has increased in recent years. Increased emphasis in industry, and by the government, on safety, efficacy and content labeling are the core drivers. Near line monitoring during the production process also affords long-term cost savings from decreased waste, rework and materials costs. The United States (FDA), European Union and various other regulatory bodies around the world strictly regulate the allowable concentrations of heavy metal contaminants in foodstuffs, drugs, and cosmetics. In addition, much commercial food production requires careful monitoring of salt concentrations to ensure correct flavor characteristics. Cosmetics that use metal oxides for sunscreen protection factor (SPF) enhancement must have 100% quality inspection to meet U.S. over-the-counter (OTC) pharmaceutical regulations. Packaging must also be monitored for contaminants that may leach into products. To aid in the understanding of certain aspects of cosmetics' chemistry, Rigaku makes a range of X-ray fluorescence (XRF for elemental analysis) and X-ray diffraction (XRD for phase and structural analysis) instruments for both research and production applications. Our small angle X-ray scattering (SAXS) instruments are the perfect solution for particle size analysis of optically opaque formulations.
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
EDXRF spectrometer with powerful Windows® software and optional FP.
High-speed, stationary sample microtomography of large samples
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
Ultra-high resolution nanotomography using parallel beam geometry
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
High-resolution benchtop microtomography of large samples