The composition, structure, properties, behavior and changes substances undergo during a reaction with other substances or in different environmental conditions are important material characteristics. Element analysis of the main components and trace elements can be performed with X-ray Fluorescence (XRF), and crystal structure determination and phase analysis and quantification are studied with X-ray Diffraction (XRD) in your lab or fab. X-ray analysis examines powders, solids, liquids, pastes, films or single crystals. Rigaku offers a wide range of solutions for both academic research and industrial applications for any composition and type of structural information obtainable by X-rays: XRD (X-ray Diffraction) in combination with DCS, CT (Computed Tomography), SAXS (Small Angle X-ray Scattering), WAXS (Wide Angle X-ray Scattering), XRR (X-ray Reflectivity), and XRT (X-ray Topography).
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High power, tube above, sequential WDXRF spectrometer
Our most popular diffractometer for single crystal analysis, configured with either single or dual microfocus sealed tube X-ray sources and an extremely low noise direct X-ray detection detector.
A benchtop single crystal X-ray diffractometer ideal for chemical crystallography and teaching.
A modern single crystal X-ray diffractometer for structural analysis configured with microfocus sealed tube technology and a direct X-ray detection detector.
Our most popular diffractometer for measuring difficult samples, configured with a high-flux rotating anode X-ray source and an extremely low noise direct X-ray detection detector.
A dual-wavelength, high-flux, rotating anode X-ray diffractometer specifically configured for measuring difficult samples as well as providing versatility through multiple wavelengths.
A bespoke, extremely high-flux diffractometer with custom enclosure and the flexibility to utilize both ports of the rotating anode X-ray source.
A curved single crystal X-ray diffraction detector based on direct X-ray detection technology with a higher 2θ range compared to a flat detector.
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
User-inspired data collection and data processing software for small molecule and protein crystallography.
The smallest detachable motorized goniometer head on the market.
Robotic sample changer to provide unattended data acquisition, enhanced productivity and standardized workflow to your research environment.
Automated tool for performing in situ crystallography experiments on existing X-ray diffractometers.
Automated crystal transport, orientation and retrieval robot specifically designed for high throughput structural biology.
Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
EDXRF spectrometer with powerful Windows® software and optional FP.
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
Extremely low noise detector based on direct X-ray detection technology.
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers
Extremely low noise, compact, detector based on direct X-ray detection technology.
A curved detector based on direct X-ray detection technology with the highest 2θ range at a single position available for the home lab.
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
High-resolution benchtop microtomography of large samples