Nanotechnology and Material Sciences

X-ray analyses for atomic to nano-scale perspective

Owing to its short wavelength, X‑rays are the optimal probe to study atomic to nanoscale structures. X‑ray diffraction (XRD) and scattering instruments and technologies play an essential role in these areas. We also provide X‑ray fluorescence (XRF) spectrometers for elemental analysis, X‑ray computed tomography (CT) for non-destructive imaging, and thermal analysis instruments for thermodynamic studies. Rigaku's easy-to-use analytical instruments can uncomplicate all of these material analyses so you can focus on your tasks.

Nanotechnology and materials science

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Material science research

XRF, XRD, and X-ray scattering techniques enable detailed analysis of elemental composition, crystalline phases, layer thickness, and molecular structure in diverse fields like biology, chemistry, physics, and engineering.

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XRD can measure atomic distances in diverse nanostructures, while small angle X-ray scattering (SAXS) provides information about nano-scale structures and morphologies. Both techniques play a crucial role in nanotechnology materials research.

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Advanced & new materials

New materials research often pushes the limit of conventional analysis techniques, requiring studying extremely thin films or imaging individual dislocations across a 12-inch wafer. We have been partnering with industry leaders for decades to develop new techniques to meet these needs.

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We provide comprehensive XRF, XRD, SAXS, X-ray imaging, thermal analysis, and Raman spectroscopy solutions to study liquids, powders, solids, films, or single crystals. These tools are all easy to use and support both academic and industrial research.

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Coatings and thin films

Coatings and thin films require optimized analysis techniques. We provide XRF and XRR for thickness and composition determination and XRD for crystallographic orientation and texture analyses. These tools are widely used from process control to academic research.

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Metals and alloys

Strength and integrity are often critical qualities of metal parts, and they can be studied and controlled by using various analysis techniques, including XRF for elemental composition, XRD for crystalline phase and orientation, and X-ray CT for voids and cracks.

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Polymers and plastics

Polymers and plastics have different aspects that need to be studied for research and process control. XRF identifies additive concentrations, adhering to RoHS/WEEE regulations. XRD identifies polymorphous and calculates percent crystallinity. SAXS explores nanoscale periodic structures, and X-ray CT reveals pores and fillers.

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composite 1200x627

Composites are a combination of two or more materials, and how each element is distributed influences the material's characteristics. High-resolution X-ray CT is a powerful technique that can image the size, shape, and distribution of fibers and fillers in composites.

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ceramics 1200x627

XRD is one of the most commonly used techniques to study crystalline phase composition and structures, which can significantly affect ceramics' characteristics. XRF is also used for elemental analysis.

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Application notes

Explore the example analyses to see which analytical technique is right for you.

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