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Cement Analysis

Using XRD and XRF for Cement Analysis

Rigaku is well known for its expertise in suppling high-quality X-ray analysis systems and has solutions for addressing the analytical requirements of the cement production process. XRD and XRF are used in the following cement production areas: Raw materials, raw meal, clinker, cement and ready mix, providing complimentary datasets.



For qualitative and phase analysis of cement, raw meal and clinker, X-ray diffraction is a direct analysis method for qualitative and quantitative multi-phase analysis of a cement sample. Rigaku offer two XRD systems suited to the routine analysis of cement. The high throughput SmartLab and benchtop MiniFlex are both ideally suited to cement analysis providing fast and accurate analyses via an intuitive, easy-to-use interface.



A laboratory or research instrument for high-throughput and quality control applications and in-depth research analysis.



A benchtop XRD with multi-sample changer for fast analysis.




Wavelength Dispersive XRF is implemented during the clinker and raw meal stages of the cement process to establish quantitative elemental analysis of the mixtures.


A powerful laboratory instrument for frequent sampling.



A benchtop XRF spectrometer with multi-sample changer for fast analysis.




Energy Dispersive XRF tools are commonly used for rapid and accurate elemental analysis for inline processes due to their fast response time and small size. These systems are also relied on for QC measurements.


Rapid qualitative and quantitative elemental analysis from Na to U.



A reliable and rugged low-cost system for QC measurements around the cement plant, making it an ideal tool throughout the quality control process and as a backup to WDXRF systems. The NEX QC is applicable to clinker and raw meal materials, and can be used simply to measure gypsum (SO3) in finished cement.



Why isn’t XRF all the same?

The main difference between ED and WD XRF is the resolution of the data. EDXRF is in the range of 150 eV to 300 eV where as WDXRF has higher resolution between around 5 to 20 eV. To achieve high resolution and low background, WDXRF requires a more complicated optical path (think diffracting crystals and collimators) which have the effect of increasing the measurement time due to a reduction in X-ray’s at the sample, it also increases the cost. With EDXRF, measurements are more efficient meaning that a lower powered X-ray source is used and can measure an entire spectrum at once so that all elements can be detected simultaneously.

What does that mean for cement?

Use EDXRF for quality control and in-line analysis and compliment with WDXRF for enhanced measurements to optimize your manufacturing processes.