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Fast, flexible stress measurements

AppNote XRD-SLST_01: fast flexible stress measurements

Background

Many mechanically processed components face residual stress problems, which makes them susceptible to fatigue or mechanical failure in their operational environment. Stress measurement techniques have been developed to evaluate quantitatively the magnitude of the residual stress. X-ray diffraction, a non-destructive technique, has been used for decades, largely because it does not alter the original state of the sample. The automated Rigaku SmartLab diffractometer makes stress analysis much easier and faster, requiring minimal user input and experience.

Rigaku SmartLab diffractometer, with a built-in Eulerian cradle, is designed for multi-purpose applications. No additional attachments are needed to perform stress measurements using either the side-inclination or the iso-inclination technique. Using an X-ray mirror contained in the Cross-Beam Optics (CBO) module, the X-ray radiation is conditioned into a parallel beam (PB) to minimize the peak position error caused by sample morphology. The combination of PB optics and the motorized three-way translation sample stage allows samples of various dimensions, even irregularly shaped, to be mounted and aligned automatically. Mapping of the stress distribution in an area up to 6” x 6” can be achieved,

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