Skip to main content

Suppression of the umbrella effect due to differences in Soller slits

With the MiniFlex300/600, it is possible to select Soller slits with small widths in order to obtain high resolution. In particular, the 0.5° receiving Soller slit and the 5 mm or 2 mm incident high limiting (DHL) slits can suppress the axial divergence, or umbrella effect which is prominent on the low-angle side. Fig. 1 shows a comparison of the X-ray diffraction profiles of zeolite-A when the receiving Soller slit and DHL are changed (the incident Soller slit is 2.5°). Intensity is normalized, and the actual intensity ratios are as shown in Table 1.

Table 1: Intensity ratios and full width at half maximum due to differences in Soller slits
Figure 1: Comparison of profile ratios when using
Soller slits with different widths (Intensity is normalized)

Using the D/teX Ultra high-speed 1-dimensional detector is effective not only for rapid measurement, but also for detecting trace components. Fig. 2 shows the X-ray diffraction pattern and qualitative analysis results for a mineral sample, obtained in a measurement time of 1 minute. This enables qualitative analysis, with good sensitivity, and evaluation in an extremely short measurement time of mixed mineral samples with multiple components. 

Figure 2: X-ray diffraction patterns obtained from mesoporous silica
and relative face spacing values when d₁ is set to 1