Rigaku Journal
Winter 2013, Volume 29, No. 1
- Crystal defects in SiC wafers and a new X-ray topography system by Kazuhiko Omote
- Evaluation of power semiconductor device wafers by total reflection X-ray fluorescence spectrometers by Hiroshi Kohno
- Introduction to single crystal X-ray analysis III: Obtaining quality data from a microcrystal by Akihito Yamano and Mikio Yamasaki
- Improvements for high-pressure cell measurements using the latest single crystal laboratory systems by Hiroyasu Sato
- X-ray fluorescence attachment for rapid in-house evaluation of heavy atom derivative crystals in protein crystallography and in-house MAD using the dual wavelength system by Takashi Matsumoto, Kimiko Hasegawa and Tomokazu Hasegawa
- Analysis of environmental samples using an energy-dispersive X-ray fluorescence spectrometer NEX CG by Takao Moriyama
- Curved imaging plate X-ray diffraction system DualSource RAPID II
- Sequential benchtop WDXRF spectrometer Supermini200
- Integrated platform SmartStudio
Summer 2012, Volume 28, No. 2
- Introduction to single crystal X-ray analysis II: Mounting crystals by Akihito Yamano
- Multi-purpose X-ray diffractometer equipped with Kα₁ optical system and ab initio powder crystal structure analysis by Akimitsu Nedu
- Size-strain analysis using the fundamental parameter (FP) method by Akihiro Himeda
- XRF analysis by the fusion method for oxide powder on a benchtop WDXRF spectrometer Supermini by Yasujiro Yamada
- Benchtop X-ray diffractometer | MiniFlex300 | MiniFlex600
- Small angle X-ray scattering Kratky camera system BioSAXS-1000
Winter 2012, Volume 28, No. 1
- Characterization in lithium ion battery by Hikari Takahara
- The latest X-ray diffraction techniques for advanced research and development in lithium-ion battery materials by Akira Kishi
- X-ray thin-film measurement techniques VIII: Detectors and series summary by Shintaro Kobayashi and Katsuhiko Inaba
- Introduction to single crystal X-ray analysis 1. What is X-ray crystallography? by Kimimko Hasegawa
- Simultaneous measurement system of thermogravimetry-differential thermal analysis and photoionization mass spectroscopy equipped with a skimmer-type interface
TG-DTA-PIMS by Tadashi Arii - TXRF 3800e: Total reflection X-ray fluorescence spectrometer
- PDXL 2: Advanced integrated X-ray powder diffraction suite
Summer 2011, Volume 27, No. 2
- Ribosome structure—A milestone of single crystal X-ray analysis by Akihito Yamano
- X-ray thin film measurement techniques VII. Pole figure measurement by Keigo Nagao and Erina Kagami
- Micro-area X-ray diffractometry by Keigo Nagao
- Analysis of twinned crystals by Hiroyasu Sato and Akihito Yamano
- Wavelength-dispersive X-ray fluorescence spectrometer ZSX PrimusIII+
- Battery cell attachment In situ X-ray diffractometry for observations of structural change in electrode materials during charging and discharging
Winter 2011, Volume 27, No. 1
- X-ray thin-film measurement techniques VI. Small Angle X-ray Scattering by Aya Ogi and Katsuhiko Inaba
- Making high speed, high resolution measurements using MiniFlex II+D/teX Ultra by Yukiko Namatame
- Detailed observations of dynamic changes such as phase transitions, melting and crystallization using an XRD-DSC with a high-speed, high-sensitivity two-dimensional PILATUS detector by Akira Kishi
- Technical know-how in thermal analysis measurement by Kazuko Motomura and Lani Llego Celiz
- Bench-top X-ray diffractometer MiniFlex II+D/teX Ultra
- Dual wavelength rotating anode system MicroMax007 VariMax DW
Summer 2010, Volume 26, No. 2
- X-ray thin-film measurement techniques V by Miho Yasaka
- Ab initio crystal structure analysis based on powder diffraction data using PDXL by Akito Sasaki, Akihiro Himeda, Hisashi Konaka and Norihiro Muroyama
- X-ray fluorescence analysis by fused bead method for ores and rocks by Yasujiro Yamada
- Technical know-how in thermal analysis measurement: Thermal analysis under water vapor atmosphere by Yasuaki Masuda and Lani Llego Celiz
- Powder diffraction optics for SmartLab X-ray diffractometer
- Application Package for X-ray fluorescence analysis
Winter 2010, Volume 26, No. 1
- The 2009 Nobel Prize in Chemistry by Joseph D. Ferrara
- X-ray thin-film measurement techniques IV by Shintaro Kobayashi
- High-sensitivity micro-spot elemental analysis using a WDXRF spectrometer equipped with a polycapillary lens by Yasujiro Yamada
- Technical know-how in thermal analysis measurement by Shinya Yamaguchi and Lani Llego Celiz
- High resolution spiral analyzer CALSA
- Integrated X-ray powder diffraction software PDXL
- Integrated thin film analysis software GlobalFit (Reflectivity analysis)
Summer 2009, Volume 25, No. 2
- X-ray thin-film measurement techniques III - High resolution x-ray diffractometry by Takayuki Konya
- Simultaneous measurement instrument for X-ray diffraction and differential scanning calorimetry using high-speed one-dimensional X-ray detector by Akira Kishi
- Analysis of cement according to ASTM C114 and JIS R5204 using Supermini benchtop WDX spectrometer by Kenji Watanabe
- Technical know-how in thermal analysis measurement by Yasuaki Masuda and Lani Llego Celiz
- Multi-channel X-ray flouorescence spectrometer Simultix 14
- Integrated thin film analysis software GlobalFit (Rocking Curve Analysis)
Spring 2009, Volume 25, No. 1
- Grazing-incidence small-angle scattering technique for nanostructure determination of surfaces and interfaces of thin films by Yoshiyasu Ito
- X-ray thin film measurement techniques II: Out-of-plane diffraction measurements
by Toru Mitsunaga - Trace heavy element analysis of wastewater and river water by X-ray fluorescence spectrometry by Takao Moriyama
- Technical know-how in thermal analysis measurement by Yasuaki Masuda and Lani Llego Celiz
- XtaLAB mini product overview
- Thermo plus Evo product overview
- CSDA (Crystallite Size Distribution Analysis software) product overview
Spring 2008, Volume 24, No. 1
- Mulitlayer optics for X-ray analysis by Kazuaki Shimizu and Kazuhiko Omote
- X-ray thin-film measurement techniques by Katsuhiko Inaba
- Structure analysis of cement and concrete materials using X-ray powder diffraction technique by Kunisha Sugimoto
- X-ray fluorescence analysis of rocks using a benchtop X-ray fluorescence
spectometer, Supermini by Kohei Kansai - Ultima IV product overview
- Supermini product overview
- D/teX Ultra product overview
